Integrated photonics including waveguiding material

ABSTRACT

A photonic structure can include in one aspect one or more waveguides formed by patterning of waveguiding material adapted to propagate light energy. Such waveguiding material may include one or more of silicon (single-, poly-, or non-crystalline) and silicon nitride.

CROSS REFERENCE TO RELATED APPLICATIONS

This application claims the benefit of priority of U.S. Provisional App.No. 62/099,848 filed Jan. 5, 2015 entitled “INTEGRATED PHOTONICS PROCESSON SOI WAFER” which is incorporated herein by reference in its entirety.U.S. patent application Ser. No. 14/987,693 filed Jan. 4, 2016 entitled“INTEGRATED PHOTONICS INCLUDING GERMANIUM” is incorporated herein byreference in its entirety.

GOVERNMENT RIGHTS STATEMENT

This invention was made with government support under Defense AdvancedResearch Projects Agency (DARPA) of the United States, under grantcontract number HR0011-12-2-0007. The government may have certain rightsin the invention.

FIELD

The present disclosure relates to photonics generally and specificallyto photonic structures and processes for fabrication.

BACKGROUND

Commercially available photonic integrated circuits are fabricated onwafers, such as bulk silicon or silicon-on-insulator wafers.

In one aspect photonics integrated circuits can include waveguides fortransmission of optical signals between different areas of a photonicintegrated circuit chip as well as on and off the chip. Commerciallyavailable waveguides are of rectangular or ridge geometry and arefabricated in silicon (single or polycrystalline) or silicon nitride.

Commercially available photonics integrated circuits can includephotodetectors and other optical components. Photonic integratedcircuits rely on the emission, modulation and the detection of light inthe communication band (about 1.3 μm to about 1.55 μm). A bandgapabsorption edge in germanium is near 1.58 μm. Germanium has beenobserved to provide sufficient photo-response for optoelectronicapplications using 1.3 μm and 1.55 μm carrier wavelengths.

BRIEF DESCRIPTION

The shortcomings of the prior art are overcome, and additionaladvantages are provided, through the provision, in one aspect, of aphotonic structure.

A photonic structure can include in one aspect one or more waveguidesformed by patterning of waveguiding material adapted to propagate lightenergy. Such waveguiding material may include one or more of silicon(single-, poly-, or non-crystalline) or silicon nitride.

Additional features and advantages are realized through the techniquesof the present disclosure.

BRIEF DESCRIPTION OF THE SEVERAL VIEWS OF THE DRAWINGS

One or more aspects of the present disclosure are particularly pointedout and distinctly claimed as examples in the claims at the conclusionof the specification. The foregoing and other objects, features, andadvantages of the disclosure are apparent from the following detaileddescription taken in conjunction with the accompanying drawings inwhich:

FIG. 1 is a cross sectional view of a wafer pre-constructed for thefabrication of photonic structures;

FIG. 2 is a cross sectional view of the photonic structure in anintermediary stage of fabrication after pattering of multiple exemplaryridge-type waveguides using a first set of hardmask materials;

FIG. 3 is a cross sectional view of a photonic structure in anintermediary stage of fabrication after formation of multiple exemplarygeometries of waveguides (rectangular and ridge) using a second set ofhardmask materials;

FIG. 4 is a cross sectional view of a photonic structure in anintermediary stage of fabrication after removal of hardmask/softmaskmaterials and deposition, planarization, and encapsulation usinglow-temperature oxide;

FIG. 5 is a cross sectional view of an exemplary photonic structurehaving multiple-geometry waveguides formed at multiple elevations;

FIG. 6 is a cross sectional view of a photonic structure afterdeposition of a second waveguiding layer over a first waveguiding layer;

FIG. 7 is a cross sectional view of a photonic structure in anintermediary stage of fabrication after being subject to planarizationand surface smoothing;

FIG. 8 is a cross sectional view of a photonic structure in anintermediary stage of fabrication after waveguide patterning andsidewall roughness treatment;

FIG. 9 is a cross sectional view of a photonic structure in anintermediary stage of fabrication after deposition of a third waveguideover a second waveguiding layer;

FIG. 10 is a cross sectional view of a photonic structure in anintermediary stage of fabrication after waveguiding layer planarizationand smoothing, patterning of waveguides from a layer formed of a secondwaveguiding material, sidewall roughness treatment, and deposition,planarization, and encapsulation using low-temperature oxide;

FIG. 11 is a cross sectional view of a photonic structure in anintermediary stage of fabrication after formation and planarization of alayer of waveguiding material (for example: amorphous orpoly-crystalline silicon);

FIG. 12 is a cross sectional view of a photonic structure in anintermediary stage of fabrication after patterning and sidewallroughness treatment of a layer formed of waveguiding material;

FIG. 13 is a flow diagram illustrating a method for fabrication of aphotonic structure for use in photodetectors;

FIG. 14 is a photonic structure in an intermediary stage of fabricationafter formation of a detector trench in planarized oxide overwaveguiding features in crystalline silicon;

FIG. 15 is a photonic structure in an intermediary stage of fabricationafter cycles of selective epitaxial growth and in-situ annealing to forma low defect-count single-crystalline germanium formation that overfillsa trench;

FIG. 16 is a photonic structure in an intermediary stage of fabricationafter planarizing the overgrown portion of the germanium formation;

FIG. 17 is a photonic structure in an intermediary stage of fabricationafter formation of conductive top contact and capping with a layerformed of a first hardmask material;

FIG. 18 is a photonic structure in an intermediary stage of fabricationafter formation of a conductive bottom contact and capping with a layerformed of a second hardmask material;

FIG. 19 is a photonic structure in an intermediary stage of fabricationafter formation of a patterned conductive first wiring level;

FIG. 20 is a photonic structure in an intermediary stage of fabricationafter formation of a patterned conductive second wiring level;

FIG. 21 is a photonic structure in an intermediate stage of fabricationhaving a waveguiding layer at a common elevation with a wiring level;

FIG. 22 is a photonic structure in an intermediate stage of fabricationhaving a photonic component embedded in an assembly created by bonding.

DETAILED DESCRIPTION

Aspects of the present disclosure and certain features, advantages, anddetails thereof, are explained more fully below with reference to thenon-limiting examples illustrated in the accompanying drawings.Descriptions of well-known materials, fabrication tools, processingtechniques, etc., are omitted so as not to unnecessarily obscure thedisclosure in detail. It should be understood, however, that thedetailed description and the specific examples, while indicating aspectsof the disclosure, are given by way of illustration only, and not by wayof limitation. Various substitutions, modifications, additions, and/orarrangements, within the spirit and/or scope of the underlying inventiveconcepts will be apparent to those skilled in the art from thisdisclosure.

A photonic structure can include in one aspect one or more waveguidesformed by patterning of waveguiding material adapted to propagate lightenergy. Such waveguiding material may include one or more of silicon(single-, poly-, or non-crystalline) and silicon nitride. Additionaldielectric material over the one or more waveguides may serve ascladding and separation material.

In one embodiment, one or more photosensitive detectors fabricated fromembedded epitaxial germanium may be included in the photonic structureto allow high-speed and efficient detection of optical signals.

In one embodiment, a pre-constructed wafer can be used for thefabrication of the disclosed photonic structure.

In one embodiment, there is set forth herein a photonic structurefabricated using one or more layers formed of hardmask material. The oneor more layers of hardmask material allow for in-situ and ex-situcleaning of residue generated by dry-etching equipment, and concurrentlypreventing the consumption of material from a waveguiding layer duringfabrication.

In one embodiment, a photonic structure can include waveguides of one ormore geometries (for example, rectangular or ridge-type) and one or moredifferent sizes patterned using a single layer of waveguiding materialor distributed over multiple levels of similar or dissimilar waveguidingmaterial layers. Waveguiding layers herein can be regarded as photoniclayers.

In one embodiment, the fabrication processes can include forming acladding layer using non-conformal materials over one or more formedwaveguide employing high-aspect-ratio processing (HARP).Non-conformality may be achieved using plasma enhancements during thedeposition process, with conditions tuned to enhance deposition rates onhorizontal surfaces while suppressing deposition rates on verticalsurfaces (at step edges). Thus, voids and other defects resulting frompinch off of a cladding layer can be avoided, and detrimental effects ofthe same on optical properties can be minimized.

In one embodiment, a photonic structure can be fabricated to include oneor more nitride waveguides using high-quality low-thermal-budgetplasma-enhanced chemical vapor deposition (PECVD).

In one embodiment, a photonic structure can be fabricated to include oneor more poly-crystalline or amorphous waveguides using chemical vapordeposition from various precursors (for example, silane forpoly-crystalline, and disilane for amorphous).

In one embodiment, a photonic structure can include waveguides patternedfrom one or more waveguiding layers of dissimilar waveguiding material.The waveguiding materials of the different layers may also include acombination of common and dissimilar materials. A dielectric layer canseparate the different waveguiding layers. Where a photonic structureincludes a plurality of waveguiding layers, the plurality of waveguidinglayers can be provided at a common elevation or at different elevations.

In one embodiment, a photonic structure can include a photodetectorformed of germanium adjacent to a silicon layer. In particular, thisdisclosure describes a method that eliminates the need forlow-temperature buffer layers between the germanium formation and thelayer formed of silicon. In one embodiment, the germanium photodetectormaterial can be formed using a process wherein volumes of germanium areiteratively deposited and in-situ annealed.

In one embodiment, the disclosed photodetector includes a via topcontact arrangement wherein a spacing distance between a germaniumformation perimeter (in contact with trench oxide) and an ionimplantation region perimeter can be equal to or greater than athreshold distance. In another aspect a spacing distance between an ionimplantation region perimeter and a contact perimeter can be equal to orgreater than a threshold distance. Providing a photodetector to includea substantial trench to ion implantation region distance and trench tocontact distance can avoid formation of leakage paths about a formedphotodetector.

In one embodiment a top most contact wiring layer of a fabricatedphotodetector can be formed of an appropriate metal contact. Thetermination wiring layer formed of an appropriate metal contact can beadapted to accommodate wiring bonds and allow for improvedtemperature-dependent operation.

In one embodiment, a dual damascene process can be employed forfabrication of a wiring layer, where connecting vias and wiring trenchesare produced in separate patterning steps, but filled with a conductivemetal material and planarized with a common deposition and planarizationprocess.

In one embodiment, a method of fabricating a photonic structure caninclude forming a layer of dielectric material over a waveguide, etchinga trench in the layer of the dielectric material, epitaxially growinggermanium within the trench, annealing germanium formed by theepitaxially growing, repeating the epitaxially growing and annealinguntil formed germanium sufficiently overfills the trench, andplanarizing a portion of the germanium that overfills the trench.Processes for fabrication of n and p regions, contact interfaces, andcontacts can be performed to define a photonic structure having aphotodetector.

Epitaxially grown and annealed germanium may contain doped or undopedportions. Where a semiconductor structure includes intrinsic germanium,a semiconductor structure can define a p-i-n or n-i-p photodetectorstructure by in-situ doping or other ion-implantation methods. In oneembodiment, a vertical photodetector can be formed on asilicon-on-insulator (SOI) wafer, wherein a top silicon layer of the SOIwafer can be etched to define a silicon waveguide. In one aspect aformed photodetector can include germanium and silicon and can be absenta low-temperature silicon germanium (SiGe) or Ge buffer between thesilicon and the germanium.

In one aspect, a photonic structure and method of fabrication can beprovided wherein waveguides of different geometries can be fabricatedover a thick buried-oxide (BOX) silicon-on-insulator (SOI) wafer. In oneembodiment, waveguides of different geometries and/or sizes can befabricated by patterning of a layer of waveguiding material. In oneembodiment, waveguides of different geometries and/or sizes can befabricated by patterning of a layer of waveguiding material where thelayer of waveguiding material can be provided by a top layer of a SOIwafer. In one embodiment, there can be used one or more layer ofhardmask material e.g. silicon dioxide (SiO₂) for fabrication ofwaveguides.

Referring to FIG. 1 there is shown a pre-constructed silicon oninsulator (SOI) wafer 102 appropriate for the fabrication of photonicstructures. SOI wafer 102 can include a substrate 100 formed of silicon,a layer 110 formed of a dielectric material, e.g. oxide and layer 210formed of silicon. SOI wafer 102 can be a photonics modified SOI waferhaving layer 110 which can be a thickened oxide layer for suppressingpropagation losses in substrate 100. Layer 110 in one embodiment caninclude a thickness of between about 1 μm and about 4 μm. Layer 210 of aphotonic optimized SOI wafer in one embodiment can be formed ofintrinsic (undoped) or lightly-doped crystalline silicon. Layer 110 andlayer 210 of SOI wafer 102 can be fabricated e.g. by wafer bonding orimplantation of oxygen followed by annealing.

Further referring to FIG. 1, the top silicon layer 210 can be tailoredto the thickness desired by photonics design e.g. by epitaxial growth(thickening), or chemical etching or oxidation and oxide removal(thinning).

In one aspect, photonic structure 10 can include formed waveguides ofone or more different geometries and/or one or more different sizes. Inreference to FIGS. 1-12 there is described fabrication of a photonicstructure 10 in one particular embodiment wherein waveguides e.g.waveguides 2101, 2102 and 2103 of multiple geometries and multipleminimal thicknesses can be fabricated from a single layer of silicon,e.g. layer 210. In one embodiment, layer 210 can be provided by a toplayer of SOI wafer 102 formed of silicon.

A method of fabrication of a photonic structure having one or morewaveguide is described with reference to FIGS. 1-12.

Referring to FIG. 1 there is shown a SOI wafer 102 having a layer 100provided by silicon substrate, layer 110 which can be provided by buriedoxide (BOX), and layer 210 which can be provided by intrinsic (undoped)or lightly-doped silicon.

FIG. 2 illustrates an exemplary photonic structure 10 having a layer 210which can be regarded as a waveguiding layer and patterning forfabrication of multiple single-crystalline silicon waveguides. Thefigure depicts photonic structure 10 after multiple patterning andpartial etching of waveguiding layer 210 which can be formed of silicon,as well as removal of a softmask material, achieved using layer 211which can be a thin layer formed of first hardmask material. Layer 211can assist in maintaining the lithography feature definition, preventingattack of the remaining full-height silicon of waveguiding layer 210during the etch process, and can allow for sufficient removal ofdry-etching residue in both in-situ and ex-situ cleaning. Not shown hereare intermediate steps, such as lithography and softmask patterning.

Similar to FIG. 2, FIG. 3 illustrates a second exemplary photonicstructure 10 consisting of multiple types of single-crystalline siliconwaveguides. The figure depicts photonic structure 10 after patterningand complete etching of waveguiding layer 210 which can be formed ofsilicon, as well as removal of the softmask (e.g. organic stack)material, achieved using a layer 214 which can be a thin layer formed ofsecond hardmask material. Layer 214 which can be hardmask material canalso assist in maintaining the lithography feature definition,preventing attack of the top surface of waveguiding layer 210 during theetch process, and can allow for sufficient removal of dry-etchingresidue in both in-situ and ex-situ cleaning. Also, not shown here areintermediate steps, such as lithography and softmask patterning.

Use of one or more of layer 211 or layer 214 which can be formed ofhardmask material can reduce defects in fabricated waveguides. It wasobserved that reactive ion etching (ME) can result in polymer residueformations on sidewalls of softmasks, hardmasks, and final features. Itwas further observed that cleaning of polymer residue formations withoutlayers 211 and 214, can introduce abnormal surface defects intowaveguiding layer 210 defining formed waveguides by micro-masking infurther processing. In addition, polymer residue embedded betweenwaveguiding layer 210 formed of silicon and layer 120 formed of oxide(FIG. 4) can introduce a substantial increase in propagation loss in thecommunications band (about 1.3 μm to about 1.55 μm). Use of one or moreof layer 211 or layer 214 can protect waveguiding layer 210 from damage(e.g. via silicon consumption) when cleaning processes are performed forremoval of polymer residue formations. In another aspect layers 211 and214 formed of hardmask material can serve as a screening layer for ionimplantation for formation e.g. of contacts, sub-contacts, photonics orCMOS junctions. Regarding patterning of waveguiding layer 210,patterning of waveguiding layer 210 can be performed using a stack oforganic lithography material (a mask) formed over one or more or layer211 or layer 214. There is set forth herein a method including forming astack of hardmask material over a layer of waveguiding material;depositing a stack of softmask material formed of organic lithographymaterial over the stack of hardmask material; and patterning the stackof organic lithography material, wherein the patterning includesstopping at the stack of hardmask material. One or more of layer 211 orlayer 214 as set forth herein can be formed of hardmask material, e.g.,silicon dioxide (SiO₂).

Referring to FIG. 4, high aspect ratio processing (HARP) or other lowloss dielectric such as plasma enhanced chemical vapor deposition(PECVD) TEOS can be performed for the formation of a layer of dielectricmaterial that surrounds a fabricated waveguide. Layer 1201 can be formedabout waveguides 2101, 2102, and 2103 defined by waveguiding layer 210.In one embodiment, layer 1201 can be formed of a non-conformal oxidematerial. Use of a non-conformal oxide material for layer 1201 canreduce an incidence of voids and other defects in oxide that surroundswaveguides 2101, 2102, and 2103. A non-conformal oxide material can be amaterial that is adapted to deposit at a higher rate on horizontalsurfaces while exhibiting a suppressed sidewall deposition rate. In oneembodiment of a method for providing non-conformal oxide material, adeposition of oxide material can be plasma enhanced. It can beenvisioned (but is not depicted) that with use of conformal material forlayer 1201, pinch off can occur when layer 1201 is deposited over highaspect ratio features and accordingly can result in introduction ofvoids with oxide surrounding waveguides 2101, 2102, and 2103.

Further referring to FIG. 4, the photonic structure 10 is shown afterplanarization of a dielectric layer 1201 and capping with a dielectriclayer 1202 for providing the correct total thickness of dielectricmaterial of layer 120 for further processing. On planarization of layer1201 a top elevation of layer 1201 can be reduced. On planarization oflayer 1202 a top elevation of layer 1202 can be reduced.

With use of the fabrication stages described with reference to FIGS.1-12, waveguides of multiple different geometries and multiple minimalheights can be defined by layer 210 of SOI wafer 102. Waveguide 2101 canbe a ridge waveguide having first minimal thickness. Waveguide 2102 canbe a ridge waveguide having a second minimal thickness greater than thefirst minimal thickness. Waveguide 2103 can be a rectangular waveguidehaving a third minimal thickness greater than the second minimalthickness.

Referring to FIG. 5. photonic structure 10 in one embodiment can includewaveguides defined in multiple layers of common or dissimilar material.Exemplary photonic structures 10 as set forth herein can include one tofour or more levels of waveguiding layers with one to two or morewaveguiding materials in each level. Waveguides fabricated of differentmaterials within a photonic structure 10 can be used for the performanceof different functions. For example, silicon is easily adapted forconducting electrical current and accordingly waveguides formed ofsilicon can be used to include active devices such as photodetectors andother photonic components. Dielectric waveguides (such as siliconnitride) can be adapted for transmission of light waves over longerdistances owing to a reduced figure of absorption in the communicationswavelength range. Waveguides fabricated of other materials such asamorphous silicon or polycrystalline silicon can have a balance ofelectrical and optical properties and can be particularly useful forfunctions having a balance of current conduction and distance lighttransmission aspects.

To aid in the fabrication of a photonic structure 10 having waveguidesdefined by different waveguiding layers, photonic structure 10 caninclude layers in the form of one or more dielectric separating layersin the form of films between layers of different material.

Referring to FIG. 5 dielectric layer 1201 which can be regarded as acladding layer can be a gap-filling cladding oxide that can beplanarized by the application of a polishing process, while cappinglayer 1202 can be a second distance correcting low temperature oxidefilm. There can be provided a dielectric layer in the form of cappinglayer 1202 above the dielectric layer 1201 to provide correcteddielectric separation distance to one or more additional waveguidinglayer.

In one embodiment, capping layer 1202 can be designed to enhance thefabrication and the operation of one or more additional waveguidesdefined within a waveguiding layer formed of waveguiding material formedabove a waveguiding layer 210 formed of waveguiding material definingone or more base waveguides. Where capping layer 1202 supports one ormore device layer above layer 1202, layer 1202 can be regarded as adielectric separation layer of compatible optical properties. Layer 1202can provide physical and optical isolation between waveguiding layerse.g., waveguiding layer 210 and waveguiding layer 310 in whichwaveguides can be defined. Layer 1202 can provide a separation betweenwaveguiding layers that can be tailored for isolation or intentionaloptical coupling. Layer 1202 can provide corrected dielectric separationdistance between waveguiding layers. Material of layer 1202 can beselected to provide low propagation loss and optimize processcompatibility, especially with regard to temperature.

Further referring to FIG. 5, an exemplary fabricated photonic structure10 wherein the photonic structure 10 includes multiple waveguides isillustrated. Layer 120 can be formed of dielectric material and caninclude in the specific embodiment layer 1201 formed of dielectricmaterial surrounding waveguides (e.g. waveguide 2101 and waveguide 2102)defined by waveguiding layer 210 and waveguiding layer 410 (e.g.waveguide 4101) and layer 1202 serving as dielectric capping layerformed on the cladding layer 1201 surrounding waveguides defined bywaveguiding layer 210 and waveguiding layer 410. Layer 120 in theembodiment of FIG. 5 can further include layer 1201 formed of dielectricmaterial surrounding waveguides defined by layer 420 (e.g. waveguide4201) and layer 1202 serving as an dielectric capping layer formed onthe layer 1201 surrounding waveguides defined by waveguiding layer 420.Layer 120 in the embodiment of FIG. 5 can further include layer 1201formed of dielectric material surrounding waveguides (e.g. waveguide3101) defined by waveguiding layer 310, and layer 1202 serving as andielectric capping layer formed on the layer 1201 surrounding waveguidesdefined by waveguiding layer 310. Layer 120 in the embodiment of FIG. 5can further include layer 1201 formed of dielectric material surroundingwaveguides defined by waveguiding layer 320 (e.g. waveguide 3201), andlayer 1202 serving as a dielectric capping layer formed on the layer1201 surrounding waveguides defined by waveguiding layer 320. Layer 120in the embodiment of FIG. 5 can further include layer 1201 formed ofdielectric material surrounding waveguides defined by waveguiding layer330 (e.g. waveguide 3301), and layer 1202 serving as a dielectriccapping layer formed on the layer 1201 surrounding waveguides defined bywaveguiding layer 330. Layers 1201 can be regarded as cladding layersand layers 1202 can be regarded as capping layers. Layers 1201 andlayers 1202 can be formed of dielectric material e.g. oxide.

Referring to FIG. 5, waveguides 2101 and 2102, waveguides 3101, 3201,and 3301, and waveguides 4101 and 4201 can be encapsulated within layer120. Referring to FIG. 5, a bottom of waveguide 2101 and waveguide 2103can be formed at elevation 1102, a bottom of waveguide 4201 can beformed at elevation 1104, a bottom of waveguide 3101 and waveguide 3201can be formed at elevation 1106 and 1108, respectively. A bottom ofwaveguide 3301 can be formed at elevation 1110. Waveguides of thephotonic structure 10 as set forth in FIG. 5 can be formed of differentmaterials. Waveguide 2101 and waveguide 2102 can be formed ofsingle-crystalline silicon, and waveguide 3101, 3201, and 3301 can beformed of silicon nitride. Waveguides 4101 and 4201 can be formed ofamorphous or poly-crystalline silicon. Waveguides of photonic structure10 can have different geometries. Waveguide 2101 as shown in FIG. 5 canhave a ridge geometry. Waveguides 2102, 4101, 4201, 3201, 3301 can haverectangular geometries.

In reference to FIG. 5 there is set forth a photonic structure 10 havingphotonic layer 210, photonic layer 420, photonic layer 310, and photoniclayer 320. In one embodiment, the layers 210, 420, 310, and 320 can beregarded as first, second, third and fourth photonic layers. In oneembodiment, each of the layers 210, 420, 310, and 320 can be formed at adifferent elevation. Photonic structure 10 can include less than orgreater than the noted number of photonic layers. In one embodiment asset forth in FIG. 5, photonic structure 10 can include photonic layer330 at an elevation different than an elevation of each of layers 210,420, 310, and 320. Photonic layer 330 can be regarded as a fifthphotonic layer.

Referring to FIG. 6 through FIG. 10, exemplary fabrication of differentwaveguides of photonic structure 10 having characteristics of thephotonic structure 10 are shown. Referring to FIG. 6, photonic structure10 can include waveguide 2101, waveguide 2103 and layer 120 formed overwaveguide 2101 and waveguide 2103 wherein layer 120 can be formed of adielectric, e.g., oxide material. Layer 120 in one embodiment caninclude a combination of layer 1201 which can be regarded as a claddinglayer and layer 1202 which can be regarded as a capping layer as setforth herein. Waveguide 2101 and waveguide 2103 can be patterned in anddefined by common waveguiding layer 210.

Further referring to FIG. 6, there can be formed waveguiding layer 310over layer 120. Waveguiding layer 310 can be a nitride waveguiding layerfor use in patterning waveguides. Referring to FIG. 7, FIG. 7illustrates the photonic structure 10 of FIG. 6 after planarization ofwaveguiding layer 310. Waveguiding layer 310 can be utilized in thefabrication of a nitride waveguide, e.g., formed of silicon nitride(SiN).

In one embodiment, plasma enhanced chemical vapor deposition (PECVD) canbe employed for deposition of silicon nitride forming layer 310. PECVDcan be performed with use of reduced thermal budget, e.g., at atemperature in a temperature range of from about 300 degrees Celsius toabout 500 degrees Celsius. It was observed that certain photonic devicefabrication flows cannot sustain thermal treatments of that nature.Accordingly, PECVD silicon nitride can be advantageous.

Use of PECVD processing for deposition of waveguiding layer 310 formedof silicon nitride can be combined with additional processes forreducing the optical absorption of formed nitride. For example, layer1202 which can provide a capping layer formed of oxide and waveguidinglayer 310 which can be formed of nitride can be subject to controlledfabrication process, e.g., chemical-mechanical polishing processes tosmooth the surfaces of the oxide and nitride layers. Furthermore,deposition conditions can be controlled to adjust properties of formedmaterial. Exemplary deposition adjustments can include the alteration ofsubstrate temperature, plasma power, forward bias, chamber pressureconditions, and precursor flow ratios. The indicated condition changesgreatly depend on the chamber configuration and exact nature ofprecursors, and are therefore omitted from this disclosure. It is noted,however, that stoichiometric silicon nitride, i.e., nitride with a 3:4silicon-to-nitride ratio, can be attained under a multitude of processconditions, and a great degree of freedom exists to tailor the opticalproperties to the desired values (refractive index≈2.0 and lowpropagation losses<0.5 db/cm). Further annealing processes can beperformed on waveguiding layer 310 to remove contaminates and gaseousinclusions, thus further improving structural and optical properties.

In addition, formed nitride waveguides can be subject to line edgeroughness treatment. A steam or high-pressure oxidation at moderate tohigh temperatures can convert the few outermost nanometers of thesilicon nitride to silicon dioxide. After removal of said silicondioxide in an aqueous hydrofluoric acid solution, the average surfaceroughness of the silicon nitride is improved.

It was observed that silicon nitride waveguides can have indices ofrefraction (near 2.0) close to indices of refraction of a surroundingdielectric material (1.45) and accordingly can co-transmit a relativelylarger portion of the propagating light waves in a surroundingdielectric material. Defects (voids) and optical absorption indielectric material surrounding formed waveguides can be particularlyimportant in the case of nitride waveguides. Low overall levels ofoptical propagation loss can only be maintained with use of appropriatedielectric cladding material, e.g., gap-filling low-temperature oxide asset forth herein.

FIG. 7 depicts the photonic structure 10 after chemical-mechanicalpolish to smooth the top surface of waveguiding layer 310 formed ofsilicon nitride.

Referring to FIG. 8, the photonic structure 10 is shown after patterningof waveguiding layer 310 to form waveguides 3101 which can be followedby line-edge roughness mitigating treatment. The processing performedcan be wet oxidation followed by a brief immersion in an HF-basedsolution to remove the resulting oxide on the surface of nitridewaveguides 3101.

In a similar fashion, FIG. 9 illustrates the photonic structure 10 shownin FIG. 8 after forming of layer 120 over patterned sections ofwaveguiding layer 310. Layer 120 can include layer 1201 which can be adeposited cladding layer formed of oxide and layer 1202 which can be adeposited capping layer formed of oxide. Layer 1201 can extend to anelevation above a top elevation of waveguide 3101 and waveguide 3102.Further referring to FIG. 9 there can be formed on layer 120,waveguiding layer 410. Waveguiding layer 410 in one embodiment can be anamorphous or polycrystalline silicon layer for use in fabrication of oneor more waveguide formed of amorphous silicon or polycrystallinesilicon, subsequently subjected—but not shown—to a smoothing polish,patterning to define waveguide features, and line-edge roughnessmitigation treatment.

Line edge roughness treatments for silicon waveguides e.g. waveguide2101 or waveguide 2103 may also include techniques such as H₂ annealingusing reduced pressure chemical vapor deposition (RPCVD) or rapidthermal chemical vapor deposition (RTCVD) processing or depositingepitaxial silicon on silicon waveguides. The H₂ annealing can beperformed at a temperature of between about 700 degrees Celsius andabout 950 degrees Celsius and at a pressure of from about 1 Torr toabout 1 Atmosphere. In one example the annealing condition can include atemperature of about 900 degrees Celsius and a pressure of about 100Torr.

Referring to FIG. 10, a photonic structure 10 is schematically depictedafter patterning of waveguiding layer 410 to define waveguides 4102 andafter formation of a section of layer 120 over waveguiding layer 410. Asshown in FIG. 10, layer 120 can include layer 1201 which can be acladding layer surrounding waveguides 4102 defined by waveguiding layer410 and layer 1202 formed on layer 1201 surrounding waveguides 4102defined by waveguiding layer 410. Layer 1201 and layer 1202 can beformed of dielectric material, e.g., oxide.

FIGS. 11 and 12 illustrate a method for fabricating exemplaryimplementation of photonic structure 10 as shown in FIG. 8 havingwaveguides of different materials (e.g. waveguides 3101 and 4001) formedat a common elevation.

Referring to FIG. 11, layer 130 which can be a thin dielectric materialand layer 400 which can be formed of amorphous silicon orpolycrystalline silicon can be deposited conformally over dielectriclayer 120 and waveguides 3101 (not shown). Referring further to FIG. 11,the exemplary photonic structure 10 is depicted after a treatment ofplanarization that serves to correct the thickness of waveguiding layer400, smooth the top surface of waveguiding layer 400, and remove almostcompletely excess material of waveguiding layer 400 over waveguides 3101defined in waveguiding layer 310.

Referring to FIG. 12, the exemplary photonic structure 10 as illustratedin FIG. 11 is shown after patterning of waveguiding layer 400 to definewaveguide 4001. Waveguiding layer 400 can be formed of amorphous siliconor polycrystalline silicon. Further referring to FIG. 12, waveguide 3101and waveguide 4001 formed of different materials can be formed at acommon elevation, disregarding the finite thickness of layer 130.Structures e.g. first and second waveguides can be regarded to have acommon elevation herein if an imaginary horizontal plane extendingparallel to substrate 100 can extend through the structures e.g. thefirst and second waveguide. In one embodiment, layer 130 can be omittedprior to formation of layer 400, resulting in the bottom of waveguide3101 and a bottom of waveguide 4001 to be formed at a common elevation.Omission of layer 130 is challenging but possible owing to the materialdissimilarities between layer 310 and layer 400.

In one embodiment, photonic structure 10 can be adapted for detection oflight in the communications wavelength range. A flow diagramillustrating a method for fabricating a photonic structure 10 having aphotodetector is illustrated in FIG. 13. According to a method in oneembodiment, there is performed at block 402 forming a layer ofdielectric material over a silicon waveguide and at block 406 etching atrench in the layer extending to the silicon waveguide. There can beperformed at block 412 epitaxially growing germanium within the trenchand at block 416 annealing germanium formed by the epitaxial growing.There can be performed repeating of the epitaxial growing and annealinguntil the germanium overfills the trench sufficiently (block 420).

As a result of performance of the method of FIG. 13 there can be formeda germanium-based photodetector that can be absent of a low-temperaturebuffer layer connecting the germanium formation to the silicon surface.The resulting photonic structure 10 defining a photodetector providesfor low leakage current and increased signal to noise ratio.

Further aspects of the method of FIG. 13 are described with reference toFIGS. 14-17 showing a photonic structure in various intermediary stagesof fabrication. There is set forth herein a silicon photonic structureand process wherein vertical photodetector integrated on asilicon-on-insulator (SOI) wafer 102. In one embodiment, a verticalphotodetector can be integrated on a SOI top silicon waveguiding levelby patterning trenches within a layer of dielectric material, e.g.,oxide, filling with crystalline germanium, planarizing the overfill ofthe germanium, and forming top and bottom contacts.

FIG. 14 depicts photonic structure 10 in an intermediary stage offabrication that illustrates performance of block 402 (formingdielectric material over a silicon waveguide) and block 406 (patterninga trench). Photonic structure 10 can include a substrate 100 formed ofsilicon, a layer 110 formed of buried oxide, a waveguide 2105 of which adetector plateau section is shown in FIG. 14, a waveguide 2103, and alayer 1201 which can be a cladding layer formed of dielectric materiale.g. oxide formed over waveguide 2105 and waveguide 2103, whichwaveguides can be patterned in and defined by waveguiding layer 210which can be formed of silicon. Layer 120 formed over waveguide 2105 andwaveguide 2103 can include layer 1201 which can be a cladding layer andlayer 1202 which can be a capping layer. Layer 1201 and layer 1202 canhave a combined thickness of greater than about 500 nm, and in oneembodiment between about 500 nm and about 1500 nm. In one embodiment,cladding layer 1201 in combination with a capping layer 1202 has acombined thickness of about 1000 nm so that a height of a formedphotodetector structure has a height of about 800 nm to about 1000 nm.

Further details of block 406 (formation of trench) are set forth withreference to FIG. 14. Photonic structure 10 as shown in FIG. 14 isillustrated after formation of a detector trench 610 which can bepatterned to extend to an underlying silicon waveguide 2105. Patterningmay be performed using e.g. one or more of lithography, dry etching, orwet chemical processing. In one embodiment, a formed trench 610 can havea depth of greater than about 500 nm, and in one embodiment in the rangeof from about 500 nm and about 1500 nm. In one embodiment, trench 610can have a depth of about 800 nm to about 1000 nm.

Further details of block 412 (epitaxially growing), block 416(annealing), and loop 420 (repeating of epitaxial growing an annealing)are set forth with reference to FIG. 15 illustrating a photonicstructure 10 in an intermediary stage of fabrication wherein a germaniumformation 640 overfills trench 610.

Prior to performance of block 412 (epitaxially growing of germanium) thephotonic structure 10 as shown in FIG. 14 can be subject to an ex-situand/or in-situ surface cleaning process consisting of a wet chemical ordry native oxide removal followed by a short in-situ high-temperaturebake in a reducing hydrogen atmosphere. The latter can be responsiblefor removing sub-stoichiometric surface oxide reformed by exposure toair between the cleaning tools and epitaxial reactor.

FIG. 15 illustrates the photonic structure of FIG. 14 after formation ofgermanium within a trench 610. By epitaxial growing and annealing ofgermanium, trench 610 patterned in layer 120 can be filled with doped orintrinsic crystalline germanium.

Referring to block 412 (epitaxially growing) and block 416 (annealing)sections of germanium can be selectively grown and annealed withintrench 610. In one embodiment, germanium can be selectively grown atblock 412 using reduced pressure chemical vapor deposition (RPCVD).Referring to block 412 (epitaxially growing of germanium) a multi-stephigh-rate deposition process can be performed at a temperature ofbetween about 550 to about 850 degrees Celsius and at a pressure ofbetween about 10 Torr and about 300 Torr using germane and H₂ as theprecursor and carrier gas, respectively. The temperature can be a stabletemperature or a variable temperature. The pressure can be a stablepressure or a variable pressure. Epitaxially growing at block 412 can beperformed without use of a doping gas (e.g. diborane for p-type, arsineor phosphine for n-type). At block 412 in one particular embodiment,about 200 nm of intrinsic (or doped) Ge can be grown selectively (toelevation 621) using germane and hydrogen at a temperature in thetemperature range of between about 550 degrees Celsius to about 700degrees Celsius and at a pressure in the temperature range of betweenabout 10 Torr to about 25 Torr.

Referring to block 416 (annealing) in one embodiment a depositionchamber can be purged and the germanium deposited by epitaxially growingat block 412 can be annealed at a temperature of between about 650degrees Celsius to about 850 degrees Celsius and at a pressure ofbetween about 100 Torr and about 600 Torr (300 Torr in one embodiment).The temperature can be a stable temperature or a variable temperature.The pressure can be a stable pressure or a variable pressure.

A germanium film formed by epitaxially growing and annealing can includeintrinsic germanium or doped germanium. For doping of formed germanium,dopant gases (such as diborane, phosphine, arsine) can be added to thesource gas, e.g., H₂, used during RPCVD epitaxial growing.

Referring to FIG. 13, block 410 and block 416 (epitaxially growing andannealing) can be repeated until (block 420) deposited germaniumsufficiently overfills trench 610. In one embodiment, an overfill can beregarded to be sufficient when an overfill allows appropriate cornercoverage. In one embodiment, six epitaxially growing and annealingcycles (about 200 nm each) can be used to overfill trench 610. Forexample, after a first (initial) expitaxially growing and annealingcycle, deposited germanium can extend to elevation 621 as shown in FIG.15. After a second epitaxially growing and annealing cycle, depositedgermanium can extend to elevation 622. After a third epitaxially growingand annealing cycle, deposited germanium can extend to elevation 623.After a fourth epitaxially growing and annealing cycle, depositedgermanium can extend to elevation 624. After a fifth epitaxially growingand annealing cycle, deposited germanium can extend to elevation 625.After a sixth epitaxially growing and annealing cycle, depositedgermanium can extend to elevation 626 and can overfill trench 610 as isdepicted in FIG. 15. The misfit of the Ge to the Si lattice due toatomic size results in a vast amount of strain-related crystal defectsthat can extend well past the initial growth interface. The annealingwithin each growing and annealing cycle can serve to annihilatedislocations and other extended defects inside formed germanium ofgermanium formation 640.

As noted epitaxially growing (block 412) and annealing (block 416) canbe repeated in a cycle until the desired fill height is achieved whichcan occur e.g. when deposited germanium sufficiently overfills trench610. It was observed that epitaxial germanium can grow at much reducedrates in the <110> and <111> crystal directions relative to the vertical<100> direction. This lag in epitaxial growth near the edges and cornersof trench 610 can be overcome by overfilling trench 610. In oneembodiment, an overfill of about 1.0 μm can be used to ensure highquality fill of trench edges and corner points. After six cycles in theembodiment depicted in FIG. 15, the top of the <100> Ge growth front hasreached the top of trench 610. For final processing, a 0.5 μm overfilldeposition/annealing cycle followed by a 0.5 μm final growth can beemployed to finalize the Ge fill. Finalizing the growth/annealingsequence with growth rather than annealing can be advantageous due toobserved redistribution of the Ge feature, especially near the cornerpoints.

In an alternative method described with reference to the intermediaryfabrication stage depicted in FIG. 15, a silicon germanium (SiGe) or Gebuffer layer can be formed on a top surface of silicon waveguide 2105prior to formation of germanium (Ge). A SiGe or Ge buffer can bedeposited using reduced pressure chemical vapor deposition (RPCVD) attemperatures in the range of from about 300 degrees Celsius to about 450degrees Celsius. Such processing can be useful in various embodiments.In one embodiment, a formed SiGe or Ge buffer can be in-situ doped(n-type or p-type). For formation of a SiGe or Ge buffer, silane (SiH₄)can be used as Si source gas and germane (GeH₄) can be used as a Gesource gas. For formation of doped buffer layer, diborane (B₂H₆),phosphine (PH₃), or arsine (AsH₃) can be used as doping gases. However,it was observed that the aforementioned low temperature range canfurnish excessively low growth rates and can necessitatedisproportionately long process durations. In addition, reactor and gaspurity requirements can become increasingly stringent as temperature islowered.

With the method set forth in reference to FIG. 13 a resulting photonicstructure 10 can be absent of a challenging low-temperature SiGe or Gebuffer and can rather include germanium formed adjacent to and directlyon a waveguide e.g. waveguide 2105 which can be formed of silicon.According to the method provided in FIG. 13, the formed photonicstructure 10 for use in a photodetector structure that is absent alow-temperature SiGe or Ge buffer can feature a reduced amount ofextended defects and therefore reduced reverse leakage current—importantfor efficiency and speed of detection of light.

The method of FIG. 13 is particularly adapted for use in creatinggermanium formations in trenches having widths of less than about 150μm. Trenches having widths of greater than about 150 μm can exhibit areduced fill height as well as severe surface roughening. Because commonoptical device trench widths in photonic devices are less than about 10μm, the method is well suitable for use with a wide range of photonicdevices. It was observed that restricting an area for growth ofgermanium e.g. to an area defined by a width of trench 610 can reduceformation of anomalous features and can facilitate growth of germaniumon a layer of silicon without a low-temperature SiGe or Ge bufferbetween a germanium formation and a silicon layer. Trench 610 can have awidth of less than about 10 μm and in one embodiment can featureexcellent fill character to widths as small as 200 nm or smaller.

Referring again to the flow diagram of FIG. 13 planarization processingcan be performed subsequent to block 420. FIG. 16 illustrates thephotonic structure of FIG. 15 after planarizing of germanium. Anoverfill portion of germanium can be removed and planarized so that atop elevation of a germanium formation 640 can be in common with a topelevation of layer 1202 which can be a capping layer. A chemicalmechanical planarization (CMP) process can be used for performance ofplanarization. A CMP process can be used that selectively removes Gewith insignificant erosion of layer 1202 which can be formed of oxide.An overgrown germanium formation 640 can exhibit a mushroom likestructure as shown in FIG. 15 with well-defined facets and sharp cornersand crests. For removal of such features, a CMP process can includeusing a modified slurry (hydroxide based) and a first soft pad followedby the use of second hard (or standard) pad.

Subsequent to planarizing, the photonic structure 10 as depicted in FIG.16 can be subject to further processing to complete fabrication of aphotodetector structure. FIG. 17 illustrates the photonic structure ofFIG. 16 after formation of top contact ion implantation region 650,depositing of a layer 1203 formed of dielectric material e.g. oxide overlayer 1202, and patterning and filling of a trench shown occupied byconductive material formation 712 with a conductive material formation712. Layer 120 formed of dielectric material can include layer 1201which can be a cladding layer, layer 1202 which can be a capping layer,and layer 1203 which can be a contact spacer layer. Further in referenceto FIG. 17 a bottom contact ion implantation region 660 can be formed inwaveguide 2105 of layer 210 prior to the construction of dielectriclayer 120 and trench 610 defined in layer 120. In an alternativeembodiment, a bottom contact ion implantation region 660 canalternatively be formed in germanium formation 640. In an alternativeembodiment, a bottom contact ion implantation region 660 canalternatively be formed partially in waveguide 2105 and partially ingermanium formation 640. Formation of ion implantation region 650 andion implantation region 660 in germanium formation 640 or in a structureadjacent to germanium formation 640 as set forth herein defines a p-i-nphotodetector structure (p region at bottom) or n-i-p photodetectorstructure (n region at bottom).

In one aspect, a location of ion implantation region 650 can berestricted to a reduced area of germanium formation 640. Ionimplantation region 650 in one embodiment can be defined within aperimeter 651. In one aspect, ion implantation region 650 can be formedto have a trench to ion implantation region spacing distance D₁ equal toor greater than a threshold distance, L₁. Spacing distance D₁ can be thedistance between perimeter 651 of ion implantation region 650 and theperimeter 641 of germanium formation 640 (in contact with layer 120which can be formed of oxide). Because perimeter 641 of germaniumformation 640 can be in contact with layer 120 that can define trench610, the spacing distance D₁ can also be the distance between perimeter651 of ion implantation region 650 and trench 610. In one embodiment,spacing distance D₁ can be substantially uniform throughout a top areaof germanium formation 640 and can be in a direction extending normallyto perimeter 651 of ion implantation region 650 and perimeter 641 ofgermanium formation 640. In such embodiment, the spacing distance D₁ canbe equal to or greater than the noted threshold distance throughout anentirety of perimeter 651 of ion implantation region 650 and theentirety of perimeter 641 of germanium formation 640. In one embodimentL₁ is 100 nm; in another embodiment 200 nm; in another embodiment 300nm; in another embodiment 400 nm, in another embodiment 500 nm; inanother embodiment 600 nm; in another embodiment 700 nm; in anotherembodiment 800 nm; in another embodiment 900 nm; in another embodiment1.0 μm. A spacing distance D₁ can be designed based on, e.g.,dimensional widening of features during processing, minimum printablefeature dimensions, and reliable maximum feature printing misalignment.

A silicon photonic structure and process is set forth herein where thegermanium photodetector structure may contain a reduced area top ionimplantation region 650 of the opposite polarity compared to the bottomion implantation region 660. By forming ion implantation region 650 tohave a trench to implantation spacing distance of D₁ an incidence ofleakage current paths can be reduced. Reverse leakage current densitiesof less than about 1 nanoamperes per square micrometer can be achievedin one embodiment using top ion implantation region 650 spaced to atrench to implantation region spacing distance D₁ of equal to or greaterthan a threshold distance L₁ of 0.75 μm from the oxide trench (atperimeter 651) on each edge. Doses and energies can be tailored forproducing a shallow ohmic contact to the conductor contact provided byconductive material formation 712, and a thin implant screening oxidecan be employed to avoid Ge sputter removal. In one embodiment, ionimplantation region 650 can be formed to define a shallow top ionimplantation.

Further referring to FIG. 17, a trench shown occupied by conductivematerial formation 712 can be formed in layer 1203. Subsequently toformation of such trench, a conductive material formation 712 can beformed in the trench shown occupied by conductive material formation712. For patterning of the trench shown occupied by conductive materialformation 712, layer 150 formed of hardmask material can be formed overlayer 1203. Layer 150 in one embodiment can have a thickness of fromabout 5 nm to about 150 nm and can be formed of dielectric hardmaskmaterial (e.g., silicon dioxide) and can serve to enhance dry etchingperformance and furnish a stopping layer in a subsequent conductorpolishing process. Conductive material formation 712 can be formed ofsemiconductor-compatible metallization material that is reflective towavelengths in the range of from about 900 nm to about 1600 nm.Conductive material formation 712 can be a germanide-free (refractory)conductive material formation. In one aspect, the trench shown occupiedby conductive material formation 712 can be patterned so that conductivematerial formation 712 has a perimeter 713 that is spaced apart from aperimeter 651 of ion implantation region 650. Referring to FIG. 17,spacing distance D₂ can be the distance between perimeter 713 of contactformation 712 and perimeter 651 of ion implantation region 650. In oneembodiment, the spacing distance D₂ can be equal to or greater than athreshold distance L₂. In one embodiment, spacing distance D₂ can besubstantially uniform throughout an area of ion implantation region 650and can be in a direction extending normally to perimeter 713 of contactformation 712 and perimeter 651 of ion implantation region 650. In suchembodiment, the spacing distance D₂ can be equal to or greater than thenoted threshold distance throughout an entirety of perimeter 713 ofconductive material formation 712 and the entirety of perimeter 651 ofion implantation region 650. In one embodiment L₂ is 100 nm; in anotherembodiment 200 nm; in another embodiment 300 nm; in another embodiment400 nm, in another embodiment 500 nm; in another embodiment 600 nm; inanother embodiment 700 nm; in another embodiment 800 nm; in anotherembodiment 900 nm; in another embodiment 1.0 μm. Forming conductivematerial formation 712 to be spaced from a perimeter 651 of ionimplantation region 650 assures that conductive material formation 712can be fully contained within an area of ion implantation region 650.There is set forth herein a silicon photonic structure and processwherein a germanium photodetector structure may include a reduced areatop metal conductive material formation 712 that is fully contained inan area of top ion implantation region 650. A spacing distance D₂ can bedesigned based on, e.g., dimensional widening of features duringprocessing, minimum printable feature dimensions, and reliable maximumfeature printing misalignment.

Prior to formation of conductive material formation 712, the trenchshown occupied by conductive material formation 712 can be subject tovarious processes so that conductive material formation 712 can besubstantially free of metal germanide phases (such as nickel germanide).Ion implantation region 650 allows for a reduced resistance connectionto a germanide-free metal top contact formed of conductive materialformation 712. In one embodiment, bottom ion implantation region 660 canbe formed in waveguide 2105 defined by layer 210 formed of silicon.

Referring to FIG. 18, a method of fabrication of photonic structure 10having a silicide contact interface is set forth herein. The photonicstructure 10 pertains to an intermediate step of fabrication afterformation of the trench shown occupied by conductive material formation722. The trench shown occupied by conductive material formation 722 canbe formed in layer 120 which can be formed of dielectric e.g. oxidematerial. After formation of the trench shown occupied by conductivematerial formation 722, a silicide formation 730 can be formed at abottom of such trench, and then conductive material formation 722 can beformed in such trench.

In another aspect, photonic structure 10 can include a silicideformation 730. For formation of silicide formation 730, a metal, e.g.,nickel (Ni) or nickel platinum (NiPt) layer can be sputtered into thetrench shown as being occupied by conductive material formation 722 andsubsequently annealed during a silicide formation stage so that theformed metal reacts with silicon of layer 210 to form silicide formation730 which can define a silicide contact interface. Silicide formation730 can be formed, e.g. of nickel silicide (NiSi) or nickel platinumsilicide. In areas of photonic structure 10 other than at an interfaceto layer 210 formed of silicon, e.g., at sidewalls defining the trenchshown as being occupied by conductive material formation 722 and at atop of layer 150, the deposited metal can remain unreacted. Prior toannealing in one embodiment, a thin capping layer (not shown, e.g.,formed of titanium nitride (TiN)) can be formed over the formed nickelor nickel platinum. The thin capping layer can protect processing toolswhich might be negatively affected by metal evaporation. Unreacted metal(e.g., Ni, NiPt) and the thin capping layer can then be removed in anappropriate wet chemical solution. Photonic structure 10 can then besubject to further annealing in a transformation stage to transformsilicide formation 730 into a low resistivity phase. The transformationstage annealing can be performed at a higher temperature than thesilicide formation annealing. In one embodiment, transformation stageannealing can be performed at a temperature of between about 300 degreesCelsius and about 550 degrees Celsius. In one embodiment, the silicideformation stage annealing can be performed at a temperature of betweenabout 350 degrees Celsius and about 500 degrees Celsius.

It was observed that challenges to the formation of silicide formation730 as shown in FIG. 18 can be imposed by the configuration of thetrench shown as being occupied by conductive material formation 722. Insome embodiments wherein the trench shown as being occupied byconductive material formation 722 includes a narrow width, e.g. lessthan about 400 nm, it was observed that formed metal, e.g. Ni, NiPt mayform preferentially on a top surface of photonic structure 10 (a top oflayer 150) or sidewalls of the trench shown as being occupied byconductive material formation 722 relative to a bottom of trench at aninterface to layer 210 which can be formed of silicon. In oneembodiment, the trench shown as being occupied by conductive materialformation 722 can include a depth of greater than about 1.3 μm and thewidth of greater than about 350 nm. To address such challenges, formedmetal formed in the trench shown as being occupied by conductivematerial formation 722 for the formation of silicide can be overfilledwithin the trench shown as being occupied by conductive materialformation 722 to assure that an appropriate volume of metal is formed atan interface to layer 210 which can be formed of silicon. In oneembodiment, wherein the trench shown as being occupied by conductivematerial formation 722 includes depth of greater than about 1.3 μm and awidth of greater than about 350 nm, of formed metal, e.g., Ni or NiPtcan be deposited, e.g., via sputtering, to a depth of four times (4×) adesired depth at a bottom of the trench shown as being occupied byconductive material formation 722. In one embodiment, a formed metal canbe deposited to a thickness of about 40 nm at a top of photonicstructure 10 as shown in the intermediary fabrication stage of FIG. 18to yield a thickness of about 10 nm at a bottom of the trench shown asbeing occupied by conductive material formation 722.

Further referring to FIG. 18, the photonic structure 10 is illustratedafter formation of a conductive material formation 722 in the trenchshown occupied by conductive material formation 722. Conductive materialformation 722 can be formed of copper (Cu) in one embodiment byperforming sputtering, plating, and a planarizing polish. Furtherreferring to FIG. 18, layer 151 can be deposited on layer 150 prior toformation of a contact within the trench shown as being occupied byconductive material formation 722. Layer 151 can be formed of adielectric hardmask material (e.g., silicon nitride) to a thickness offrom about 5 nm to about 150 nm and serves to enhance dry etchingperformance and furnish a stopping layer for a polishing process inwhich conductive material formation 722 can be polished.

Aspects of top metal wire layers of photonic structure 10 are describedwith reference to FIGS. 19 and 20.

Referring to FIG. 19, the photonic structure 10 is illustrated afterformation of layer 160, patterning to form trenches shown occupied byconductive material formations 742, and filling such trenches withconductive material formations 742. Layer 160 can formed of a dielectricmaterial e.g. oxide and can be formed over layer 151. Trenches shownoccupied by conductive material formations 742 can be formed to extendthrough layer 160, layer 151 and layer 150 to expose conductive materialformations 712 and conductive material formations 722. Conductivematerial formations 722 can include, e.g., copper, densified in alow-temperature anneal, and finally planarized so that conductivematerial formations 742 define flat wiring assemblies 742 as aredepicted in FIG. 19.

Referring to FIG. 20, the photonic structure 10 shown in FIG. 19 isdepicted after formation of layer 152 on layer 160 and formations 742and after formation of layer 170 on layer 152, followed by patterning toform trenches shown occupied by conductive material formation 752, andfilling such trenches with conductive material formations 752. Layer 170can be a dielectric material e.g. oxide and formed over layer 152 andconductive material formations 742 that define wires. Trenches shownoccupied by conductive material formations 752 can extend through layer170 and layer 152 to expose conductive material formations 742.

Conductive material formations 752 can be formed of e.g. copper,tungsten, or aluminum, densified in a low-temperature anneal, andfinally planarized so that conductive material formations 752 thatdefine wires define flat wiring assemblies. Conductive materialformations 752 as set forth in FIG. 20 can be formed of aluminum (Al) inone embodiment.

Photonic structure 10 set forth in reference to FIG. 20 can include afirst metallization level M1 having first conductive material formations742 in contact with conductive material formations 712 and 722respectively, and a second metallization level M2 having secondconductive material formations 752 in contact with conductive materialformations 742 respectively. In the embodiment of FIG. 20, metallizationlayer M1 can include a conductive material formed of copper (Cu) andmetallization level M2 can include a metal formation formed of aluminum(Al). Metallization level M2 including aluminum conductive metal candefine a contact pad for accommodation of bonded wires or lowtemperature and high temperature device measurements.

Metallization level M2 as shown in FIG. 20 like metallization level M1can be formed by a single layer damascene process wherein there isprovided single-level patterning, filling, and planarization ofconductive metallization material.

An alternative metallization damascene process is set forth in referenceto FIG. 20, although not shown. If intermediate via connections arerequired between metallization level M1 and metallization level M2 as aconsequence of circuit design, a dual damascene metallization processmay be employed where the vias and metal wire trenches for accommodatingconductive material formations 742 and conductive material formations752 are formed first through sequential patterning and etching, and thenfilled and planarized in a common deposition (e.g., sputter), plating,and polishing process. Via connections may be required if for examplemetallization level M2 wire levels need to cross metallization level M1wire levels without electrical contact. Dual damascene processes shortenthe process flow and reduce complexity compared to two separate singledamascene applications.

It was observed that commercially available deposition conditions thatform waveguiding core materials (e.g., silicon or silicon nitride)require processing temperatures of greater than about 500 degreesCelsius. As an example, disilane is commonly used to deposit amorphoussilicon at 550 degrees Celsius, and LPCVD silicon nitride is grown usingsubstrate temperatures of greater than about 750 degrees Celsius. As thetemperature of commercially available processing steps to complete themetal wiring formations on wafers can be limited to 400 degrees Celsiusfor the case of copper, traditional waveguiding core materials are notcapable of integration into the wiring level modules. However, methodsas set forth herein allow for significantly reduced substratetemperatures, thus enabling the integration of photonic elements in theback-end modules. For example, plasma enhancement during nitride CVD canreduce the processing temperature to a temperature in the range of 400degrees Celsius. Similar temperatures can also be obtained using newlong-chain precursors (such as pentasilane) during amorphous siliconCVD.

In one embodiment, with use of fabrication methods as are set forthherein the structure 10 can include photonic elements embedded in theback-end-of-the-line (BEOL) stack, after metallization is present on thewafer. Referring to FIG. 21, each via or wire metallization level suchas the shown M1 and V1, can include waveguiding features 8000 (e.g.,waveguides at an elevation in common with a bottom elevation of a wiringlevel, e.g., elevation 8001 or elevation 8003) or embedded within thebulk of a wiring level (e.g., at elevation 8002 or elevation 8004).Materials for waveguiding features embedded in BEOL assemblies can beformed, e.g., of silicon nitride or silicon. Regarding metallizationlayer V1, metallization layer V1 can be a vias metallization layer andcan include conductive material formations 762 extending through layer170, layer 153, and layer 152. Conductive material formations 762 can bein contact with conductive material formations 742. Regarding conductivematerial formations herein, e.g., formations 712, 722, 742, 752, 762,conductive material formations 712, 722, 742, 752, 762 herein can beformed, e.g., of semiconductor-compatible metallization materials. Inone embodiment, conductive material formations 712, 722, 742, 752, 762herein each can be formed of a metallization material that is adapted toreflect light at wavelengths within a communication band of wavelengthsof from about 1.3 μm to about 1.55 μm. In one embodiment, conductivematerial formations 712, 722, 742, 752, 762 herein each can be formed ofa metallization material that is adapted to reflect light at wavelengthswithin a band of wavelengths of from about 900 nm to about 1600 nm.

In one embodiment, fabrication of a photonic structure 10 as set forthin FIG. 21 having photonic elements embedded in BEOL assembly caninclude the removal of films of high refractive index (e.g., siliconnitride or nitrogen-rich SiC) from areas 8000 in the optical vicinity(typically from about 1 μm to about 10 μm) surrounding said embeddedphotonics elements. Furthermore, by way of altering the lithography maskdesign, fill and other shapes of the respective wiring levels can beeliminated from areas 8000 in the optical vicinity (typically from about1 μm to about 10 μm) surrounding said embedded photonics elements.

In one embodiment, photonic structure 10 that includes photonic elementsembedded in BEOL assembly can be subjected during the fabricationprocess to low-temperature line-edge roughness mitigation treatments,such as high-pressure oxidation followed by wet chemical oxide etching.

In one embodiment as depicted schematically in FIG. 22, photonicstructure 10 can include photonic elements embedded in assembliescreated by wafer-level or chip-level bonding, where full wafers orindividual chips can be aligned and bonded to handle wafers. Handlewafer A and bonding wafer B can each include one or more photonic layers(e.g., waveguiding layer 210 waveguiding layer 310 waveguiding layer 320and waveguiding layer 410 as shown in FIG. 22) distributed over FEOL andBEOL modules, and may be of common or dissimilar functionality.Regarding waveguiding layer 310 waveguiding layer 310 can be a siliconnitride waveguiding layer. At area 902 waveguiding layer 310 can bepatterned into a plurality of waveguides. At area 904 waveguiding layer310 can remain unpatterned. At area 904 common waveguiding layer 310formed at an elevation higher than wiring assembly 906 can be aligned tothe one or more conductive material formation defining wiring assembly906 and function as a protect layer for protecting wiring assembly 906which can include one or more copper conductive material formation.Waveguiding layer 310 at area 904 can inhibit diffusion of wiringassembly 906. Waveguiding layer 310 at area 904 can function as an etchstop layer for protection of one or more conductive material formationof wiring assembly 906. Wiring assembly 906 can configured in accordancewith any of the wiring assemblies set forth herein, e.g. in relation toFIGS. 19-21, and in one embodiment can be coupled to a definedphotodetector structure as set forth in reference to FIGS. 19-21. Wiringassembly 906 can include one or more wiring level e.g. M1, M2, V1 as setforth herein. In one embodiment, structure 10 that includes layers ofphotonic elements embedded in the bonded wafer assembly can hostwaveguiding features that can be waveguiding layers formed of siliconnitride or silicon.

In another embodiment, photonic structure 10 that includes layers ofphotonic elements embedded in the bonded wafer assembly shown in theexample of FIG. 22 can include waveguiding features defined bywaveguiding layers formed of low-temperature silicon nitride (PECVD) orsilicon (using long-chain precursors) on either wafer where temperatureswere limited to those of metal processing. In one embodiment, photonicstructure 10 that includes layers of photonic elements embedded in thebonded wafer assembly can include silicon nitride photonics elements,e.g., defined by waveguiding layer 310 formed of silicon nitride nearthe bonding interface if optical coupling from handle to bonded portionis desired. Mode confinement in silicon nitride can be reduced, thusallowing relaxed bonding alignment and cladding layer thickness controlcompared to a silicon waveguide core.

In one embodiment, fabrication of a photonic structure 10 havingphotonic elements embedded in the bonded assembly can include theremoval of films of high refractive index (e.g., silicon nitride ornitrogen-rich SiC) from areas in the optical vicinity (typically fromabout 1 μm to about 10 μm) surrounding said embedded photonics elements,on both the handle and bonding portion. Furthermore, by way of alteringthe lithography mask design, fill and other shapes of the respectivewiring levels are eliminated from areas in the optical vicinity(typically from about 1 μm to about 10 μm) surrounding said embeddedphotonics elements, on both the handle and bonding portion.

In one embodiment, photonic structure 10 that includes photonic elementsembedded in a bonded assembly can be subjected during the fabricationprocess to low-temperature line-edge roughness mitigation treatments,such as high-pressure oxidation followed by wet chemical oxide etching.

A small sample of methods apparatus and systems herein include thefollowing.

A1. A method of fabricating a photonic structure comprising: forming astack of hardmask material over a layer of waveguiding material;depositing a stack of organic lithography material over the stack ofhardmask materials; and patterning the stack of organic lithographymaterial, wherein the patterning includes stopping at the stack ofhardmask material. A2. The method of A1, wherein the method includespatterning waveguide features in the layer of waveguiding material usingthe stack of organic lithography material. A3. The method of A1, whereinthe patterning includes using reactive ion etching and wherein themethod includes cleaning formed residue formed by the reactive ionetching. A4. The method of A1, wherein the patterning includes usingreactive ion etching, wherein the method includes cleaning residueformed by the reactive ion etching, wherein the method includespatterning waveguide features in the layer of waveguiding material usingthe stack of organic material, and wherein the cleaning is performedsubsequent to the patterning.

B1. A photonic structure comprising: a plurality of photonic layersformed of a waveguiding material; wherein the plurality of photoniclayers includes a first photonic layer and a second photonic layer; andone or more waveguide defined by each of the first photonic layer andthe second photonic layer. B2. The photonic structure of B1, wherein thefirst photonic layer and the second photonic layer are formed ofdifferent waveguiding materials. B3. The photonic structure of B2,wherein each of the first photonic layer and the second photonic layeris formed of a waveguiding material selected from the group consistingof crystalline silicon, poly-crystalline silicon, amorphous silicon, andsilicon nitride. B4. The photonic structure of B1, wherein the firstphotonic layer and the second photonic layer are formed of a commonwaveguiding material. B5. The photonic structure of B1, wherein each ofthe first photonic layer and the second photonic layer is formed of awaveguiding material selected from the group consisting of crystallinesilicon, poly-crystalline silicon, amorphous silicon, and siliconnitride. B6. The photonic structure of B1, wherein the first photoniclayer and the second photonic layer are formed of different waveguidingmaterial and are formed at different elevations. B7. The photonicstructure of B1, wherein the first photonic layer and the secondphotonic layer are formed of different waveguiding material and whereinthe first photonic layer and the second photonic layer are at a commonelevation. B8. The photonic structure of B7, wherein a bottom elevationof the first photonic layer and a bottom elevation of the secondphotonic layer are formed at a common elevation. B9. The photonicstructure of B1, wherein the photonic structure includes an inter-leveldielectric layer separating the first photonic layer and the secondphotonic layer. B10. The photonic structure of B1, wherein the one ormore waveguide is of a geometry selected from the group consisting of arectangular geometry and a ridge geometry. B11. The photonic structureof B1, wherein the first photonic layer is at an elevation below thesecond photonic layer. B12. The photonic structure of B1, wherein thefirst photonic layer is at an elevation above the second photonic layer.B13. The photonic structure of B1, wherein the photonic structure isfurther characterized by a feature selected from the group consistingof: (a) first and second waveguides of different minimum thicknesses aredefined in the first photonic layer, (b) a first waveguide having afirst minimum thicknesses is defined by the first photonic layer and asecond waveguide having a second minimum thickness is defined by thesecond photonic layer; (c) waveguides of different geometries aredefined by the first photonic layer; (d) a first waveguide of a firstgeometry is defined by the first photonic layer and a second waveguideof a second geometry is defined by the second photonic layer. B14. Thephotonic structure of B1, wherein the plurality of photonic layersincludes the first photonic layer, the second photonic layer, a thirdphotonic layer and fourth photonic layer. B15. The photonic structure ofB1, wherein the plurality of photonic layers includes the first photoniclayer, the second photonic layer, a third photonic layer and fourthphotonic layers, and wherein each of the first photonic layer, thesecond photonic layer, the third photonic layer and the fourth photoniclayer is formed at a different elevation.

C1. A photonic structure comprising: a photonic layer and one or morewaveguide defined by the photonic layer, wherein the photonic structureincludes a feature selected from the group consisting of (a) first andsecond waveguides of different minimum thicknesses are defined in thephotonic layer and (b) waveguides of different geometries are defined bythe photonic layer. C2. The photonic structure of C1, wherein thephotonic layer is formed of a waveguiding material selected from thegroup consisting of crystalline silicon, poly-crystalline silicon,amorphous silicon, and silicon nitride.

D1. A method of fabricating a photonic structure comprising: patterninga first waveguide in a first photonic layer, the first photonic layerformed of a first waveguiding material; and forming a dielectric layerabout the first waveguide. D2. The method of D1, wherein dielectricmaterial of the dielectric layer includes a plasma-enhanced depositedoxide. D3. The method of D1, wherein the forming includes using plasmaenhanced chemical vapor deposition (PECVD). D4. The method of D1,wherein the forming includes forming plasma-enhanced oxide material overthe first photonic layer so that the plasma enhanced oxide materialpreferentially deposits on horizontal surfaces with suppresseddeposition rates on vertical surface proximate feature edges, resultingin an overall non-conformal film topography. D5. The method of D1,wherein the forming includes applying process conditions for depositionof non-conformal oxide material deposition in a manner to providevoid-minimized filling of minimum feature size gaps. D6. The method ofD1, wherein the method includes planarizing the dielectric layer toprovide processing planarity for further layers. D7. The method of D1,wherein the method includes forming a second dielectric layer above thedielectric layer to provide corrected dielectric separation distance toone or more additional waveguiding layer.

E1. A method of fabricating a photonic structure comprising: patterninga first waveguide in a first layer, the first layer formed of a firstwaveguiding material. E2. The method of E1, wherein processing ofwaveguiding layers and layers above the one or more waveguiding levelsinclude: removal of silicon nitride material in an optical vicinity ofwaveguides and other photonic elements using lithography, etching, andcleaning; removal of nitrogen-rich silicon carbide material in theoptical vicinity of waveguides and other photonic elements usinglithography, etching, and cleaning; omission in mask design of fillingfeatures in each waveguiding layer; omission in mask design of fillingfeatures in each metal wiring layer; omission in mask design of fillingfeatures in each connecting metal via layer. E3. The method of E1,wherein the first waveguiding material is silicon, and wherein themethod includes performing line edge roughness treatment of the firstwaveguide using H₂ annealing. E4. The method of E3, wherein the H₂annealing is performed at a temperature of between about 700 degreesCelsius and about 950 degrees Celsius.

F1. A method of fabricating a photonic structure comprising: depositinga layer formed of nitride waveguiding material; and patterning the layerformed of nitride waveguiding material to define a waveguide, whereinthe depositing includes using plasma-enhanced chemical vapor deposition.F2. The method of F1, wherein the method includes performing treatmentof the layer formed of nitride waveguiding material for correction ofone or more or contamination, inclusions, voids, or non-stoichiometries,wherein the treatment is selected from the group consisting of thermalannealing or exposure to radiation. F3. The method of F1, wherein themethod further includes planarizing and smoothing the layer formed ofnitride waveguiding material. F4. The method of F1, further comprisingdepositing a non-conformal high-aspect-ratio gap-filling dielectricmaterial over the waveguide. F5. The method of F1, wherein thedepositing a layer includes using PECVD.

G1. A method of fabricating a photodetector structure comprising:forming dielectric material over a silicon waveguide; etching a trenchin the dielectric material extending to the silicon waveguide;epitaxially growing germanium within the trench; annealing germaniumformed by the epitaxially growing; repeating the epitaxially growing andthe annealing until the germanium overfills the trench; planarizing anoverfill portion of the germanium; and creating top and bottom contactsusing ion implantation and metallization. G2. The method of G1, whereinthe epitaxially growing is performed so that germanium is formed on thesilicon waveguide. G3. The method of G1, wherein the epitaxially growingis performed so that the photodetector structure is absent alow-temperature SiGe or Ge buffer structure adjacent to the siliconwaveguide. G5. The method of G1, wherein the epitaxially growing ofgermanium is performed without use of a doping gas so that intrinsicgermanium is formed by the epitaxially growing. G6. The method of G1,wherein the epitaxially growing of germanium is performed using a dopantprecursor so that in-situ doped germanium is formed by the epitaxiallygrowing. G7. The method of G1, wherein the epitaxially growing includesperforming epitaxial growing at a temperature in the range of from about550 to about 850 degree Celsius. G8. The method of G1, wherein theepitaxially growing includes performing epitaxial growing at atemperature in the range of from about 550 to about 850 degree Celsiusand wherein the annealing includes annealing at a temperature of betweenabout 650 degrees Celsius to about 850 degrees Celsius. G9. The methodof G1, wherein the epitaxially growing includes performing epitaxialgrowing at a temperature in the range of from about 550 to about 850degree Celsius at a pressure in the range of from about 10 Torr to about300 Torr using germane (GeH₄) and H₂ as a precursor and carrier gas, andwherein the annealing includes annealing at a temperature of betweenabout 650 degrees Celsius to about 850 degrees Celsius at a pressure ofbetween about 100 Torr to about 600 Torr. G10. The method of G1, whereinthe growing is preceded by an ex-situ wet-chemical and an in-situ drycleaning process for removal of organic and metallic contamination andnative oxide. G11. The method of G1, wherein the growing is furtherpreceded by an in-situ thermal treatment in a reducing Hz-environmentfor removal of sub-stoiciometric surface silicon oxide. G12. The methodof G1, wherein the method includes performing a shallow top contact ionimplantation and depositing a capping oxide. G13. The method of G1,wherein the method includes forming a reduced area ion implantationregion spaced apart from an oxide trench. G14. The method of G1, whereinthe method includes forming a reduced area shallow top ion implantationspaced apart from an oxide trench so that there is defined spacingdistance between a perimeter of the germanium and a perimeter of the ionimplantation. G15. The method of G1, wherein the method includes forminga reduced area shallow top implantation region spaced apart from anoxide trench by a spacing distance equal to or greater than a thresholddistance. G16. The method of G1, wherein the method includes forming areduced area top metal contact that is fully contained in a top ionimplant region.

H1. A photonic structure comprising: a waveguide; a germanium formationformed on the waveguide; a first ion implantation region and a secondion implantation region, the second ion implantation region being ofopposite polarity to the first ion implantation region to form a p-i-nor n-i-p formation. H2. The photonic structure of H1, wherein thephotonic structure is absent of a low-temperature SiGe or Ge bufferbetween the waveguide and the germanium formation. H3. The photonicstructure of H1, wherein the first ion implantation region is formed inthe germanium formation. H4. The photonic structure of H1, wherein thesecond ion implantation region is formed in the waveguide. H5. Thephotonic structure of H1, wherein the second ion implantation region isformed in the waveguide and in the germanium formation.

I1. A photonic structure comprising: a waveguide; dielectric materialformed over the waveguide; a trench formed in the dielectric materialextending to the waveguide; a germanium formation formed in the trench;and an ion implantation region formed in an area of the germaniumformation so that the ion implantation region is spaced from the trenchby a spacing distance equal to or greater than a threshold distance. I2.The photonic structure of I1, wherein an entire perimeter of the ionimplantation region is spaced from the trench by a spacing distanceequal to or greater than a threshold distance. I3. The photonicstructure of I1, wherein the threshold distance is 750 nm. I4. Thephotonic structure of I1, further comprising a contact formed on the ionimplantation region in an area of the ion implantation region so thatthe contact is spaced from a perimeter of the ion implantation region bya spacing distance that is equal to or greater than a thresholddistance. I5. The photonic structure of I1, further comprising a contactformed on the ion implantation region in an area of the ion implantationregion so that an entire perimeter of the contact is spaced from aperimeter of the ion implantation region by a spacing distance that isequal to or greater than a threshold distance.

J1. A photonic structure comprising: a waveguide having an ionimplantation region; a germanium formation adapted to receive lighttransmitted by the waveguide; an oppositely doped ion implantationregion formed on the germanium formation; a silicide formation formed onthe ion implantation region of the waveguide; a conductive materialformation formed on the silicide formation; and a conductive materialformation formed on the germanium formation. J2. The photonic structureof J1, wherein the conductive material formation formed on the germaniumformation is a germanide-free (refractory) conductive materialformation. J3. The photonic structure of J1, comprising dielectricmaterial formed over the waveguide, and a trench formed in thedielectric material, wherein the silicide formation and the conductivematerial formation are formed in the trench. J4. The photonic structureof J1, comprising dielectric material formed over the germaniumformation, and a trench formed in the dielectric material, wherein theconductive material formation is formed in the trench.

K1. A photonic structure comprising: a wiring level having a conductivematerial formation that defines a wiring assembly, wherein theconductive material formation is formed of a metallization material; anda waveguiding layer; wherein the waveguiding layer is formed at anelevation of the photonic structure that is in common with or higherthan an elevation of the wiring level. K2. The photonic structure of K1,wherein the conductive material formation is formed of a metallizationmaterial that is adapted to reflect light at wavelengths within acommunication band of wavelengths of from about 1.3 μm to about 1.55 μm.K2. The photonic structure of K1, wherein the conductive materialformation is formed of a metallization material that is adapted toreflect light at wavelengths within a band of wavelengths of from about900 nm to about 1600 nm. K3. The photonic structure of K1, wherein thewaveguiding layer is formed of silicon nitride. K4. The photonicstructure of K1, wherein the waveguiding layer is formed of siliconnitride deposited using plasma enhanced chemical vapor deposition. K5.The photonic structure of K1, wherein the waveguiding layer is formed atan elevation higher than an elevation of the wiring level. K6. Thephotonic structure of K1, wherein the waveguiding layer is formed at anelevation higher than an elevation of the wiring level and includes afirst patterned section patterned to define one or more waveguide and asecond section aligned to the conductive material formation. K7. Thephotonic structure of K1, wherein the waveguiding layer is formed at anelevation higher than an elevation of the wiring level and includes afirst patterned section patterned to define one or more waveguide and asecond section aligned to the conductive material formation so that thesecond section functions as a protect layer for the conductive materialformation.

L1. A method of fabricating a photodetector structure comprising:forming dielectric material over silicon; etching a trench in thedielectric material extending to the silicon; epitaxially growinggermanium within the trench; annealing germanium formed by theepitaxially growing; repeating the epitaxially growing and the annealinguntil the germanium overfills the trench; planarizing an overfillportion of the germanium; and creating top and bottom contacts usingdoping and metallization. L2. The method of L1, wherein the epitaxiallygrowing is performed so that germanium is formed on the silicon. L3. Themethod of L1, wherein the epitaxially growing is performed so that thephotodetector structure is absent a low-temperature SiGe or Ge bufferstructure adjacent to the silicon. L4. The method of L1, wherein theepitaxially growing of germanium is performed without use of a dopinggas so that intrinsic germanium is formed by the epitaxially growing.L5. The method of L1, wherein the epitaxially growing of germanium isperformed using a dopant precursor so that in-situ doped germanium isformed by the epitaxially growing. L6. The method of L1, wherein theepitaxially growing includes performing epitaxial growing at atemperature in the range of from about 550 to about 850 degree Celsius.L7. The method of L1, wherein the epitaxially growing includesperforming epitaxial growing at a temperature in the range of from about550 to about 850 degree Celsius and wherein the annealing includesannealing at a temperature of between about 650 degrees Celsius to about850 degrees Celsius. L8. The method of L1, wherein the epitaxiallygrowing includes performing epitaxial growing at a temperature in therange of from about 550 to about 850 degree Celsius at a pressure in therange of from about 10 Torr to about 300 Torr using germane (GeH4) andH2 as a precursor and carrier gas, and wherein the annealing includesannealing at a temperature of between about 650 degrees Celsius to about850 degrees Celsius at a pressure of between about 100 Torr to about 600Torr. L9. The method of L1, wherein the growing is preceded by anex-situ wet-chemical and an in-situ dry cleaning process for removal oforganic and metallic contamination and native oxide. L10. The method ofL1, wherein the growing is further preceded by an in-situ thermaltreatment in a reducing H2-environment for removal of sub-stoiciometricsurface silicon oxide. L11. The method of L1, wherein the methodincludes performing a shallow top contact doping region and depositing acapping oxide. L12. The method of L1, wherein the method includesforming a reduced area doping region spaced apart from an oxide trench.L13. The method of L1, wherein the method includes forming a reducedarea shallow top doping region spaced apart from an oxide trench so thatthere is defined spacing distance between a perimeter of the germaniumand a perimeter of a doping region. L14. The method of L1, wherein themethod includes forming a reduced area shallow top doping region spacedapart from an oxide trench by a spacing distance equal to or greaterthan a threshold distance. L15. The method of L1, wherein the methodincludes forming a reduced area top metal contact that is fullycontained in a top doping region. L16. The method of L1, wherein thephotonic structure is absent of a low-temperature SiGe or Ge bufferbetween the silicon and the germanium formation.

M1. A photonic structure comprising: dielectric material formed oversilicon; a trench formed in the dielectric material extending to thesilicon; a germanium formation formed in the trench; and a doping regionformed in an area of the germanium formation so that the doping regionis spaced from the trench by a spacing distance equal to or greater thana threshold distance. M2. The photonic structure of M1, wherein anentire perimeter of the doping region is spaced from the trench by aspacing distance equal to or greater than a threshold distance. M3. Thephotonic structure of M1, wherein the threshold distance is selectedfrom the group consisting of (a) 200 nm to 1000 nm and (b) 750 nm. M4.The photonic structure of M1, wherein the threshold distance is 750 nm.M5. The photonic structure of M1, further comprising a contact formed onthe doping region in an area of the doping region so that the contact isspaced from a perimeter of the doping region by a spacing distance thatis equal to or greater than a threshold distance. M6. The photonicstructure of M1, further comprising a contact formed on the dopingregion in an area of the doping region so that an entire perimeter ofthe contact is spaced from a perimeter of the doping region by a spacingdistance that is equal to or greater than a threshold distance.

N1. A photonic structure comprising: silicon having a doping region; agermanium formation adapted to receive light transmitted by the silicon;an oppositely doped doping region formed on the germanium formation; asilicide formation formed on the doping region of the silicon; aconductive material formation formed on the silicide formation; and aconductive material formation formed on the germanium formation. N2. Thephotonic structure of N1, wherein the conductive material formationformed on the germanium formation is a germanide-free (refractory)conductive material formation.

O1. A method of fabricating a photonic structure comprising: depositinga layer formed of nitride waveguiding material; and patterning the layerformed of nitride waveguiding material to define photonic features,wherein the depositing includes using plasma-enhanced chemical vapordeposition. O2. The method of O1, wherein the method includes performingtreatment of the layer formed of nitride waveguiding material forcorrection of one or more or contamination, inclusions, voids, ornon-stoichiometries, wherein the treatment is selected from the groupconsisting of thermal annealing and exposure to radiation. O3. Themethod of O1, wherein the method further includes planarizing andsmoothing the layer formed of nitride waveguiding material. O4. Themethod of O1, further comprising depositing a non-conformalhigh-aspect-ratio gap-filling dielectric material over the waveguide.

P1. A method comprising: depositing a metal within a trench, the trenchhaving a bottom formed of silicon and sidewalls formed of dielectricmaterial; performing silicide formation annealing so that metal reactswith the silicon to form a silicide formation at the bottom of thetrench; performing transformation stage annealing so that the silicideformation is transformed into a low resistivity phase. P2. The method ofP1, wherein the depositing a metal results in unreacted metal beingformed on the sidewalls, and wherein the method includes forming acapping layer over the unreacted metal prior to the performing silicideformation annealing. P3. The method of P1, wherein the depositing ametal results in unreacted metal being formed on the sidewalls, whereinthe method includes forming a capping layer over the unreacted metalprior to the performing silicide formation annealing, and wherein themethod includes removing the capping layer and the unreacted metal priorto the performing transformation stage annealing. P4. The method of P1,wherein the transformation stage annealing is performed at a higherannealing temperature than the silicide formation annealing. P5. Themethod of P1, wherein the metal is selected from the group consisting ofnickel and nickel platinum. P6. The method of P1, wherein the depositinga metal is followed by a second metal deposition overfilling the trenchso that the second metal has a thickness at a top of the trench that ismultiple times a desired thickness at a bottom of the trench. P7. Themethod of P1, wherein the depositing a metal is followed by a secondmetal deposition overfilling the trench so that the second metal has athickness at a top of the trench that is more than three times a desiredthickness at a bottom of the trench. P8. The method of P1, wherein themethod of depositing a second metal includes forming copper within thetrench subsequent to formation of the silicide formation (first metal).

Q1. A method of forming a photonic structure comprising: forming aphotodetector having a bottom and top contact; forming a dielectriclayer defining a trench over the top contact; forming an aluminummetallization layer within the trench, the aluminum metallization layerbeing in communication with the top contact. Q2. The method of Q1,wherein the method includes subjecting the aluminum metallization layerto processing so that the aluminum metallization layer defines atermination layer. Q3. The method of Q1, wherein the method includesusing a damascene process to form the aluminum metallization layer, andwherein the method is performed so that the aluminum metallization layerdefines an aluminum termination over a copper conductive materialformation. Q4. The method of Q1, wherein the forming an aluminummetalization layer includes depositing aluminum using a process selectedfrom the group consisting of physical vapor deposition (PVD), chemicalvapor deposition (CVD) and evaporation. Q5. The method of Q1, whereinthe method includes performing a low temperature anneal to densify,reflow, or recrystallize the aluminum metallization layer. Q6. Themethod of Q1, wherein the method includes performing a moderatetemperature aluminum metallization compatible with existing (Cu)metallization formations. Q7. The method of Q1, wherein the methodincludes subjecting the aluminum metallization layer to processing todefine a contact pad. Q8. The method of Q1, wherein the method includesplanarizing the aluminum metalization layer so that the aluminummetallization layer defines a flat wiring assembly. Q9. The method ofQ1, wherein the method includes performing a dual-patterning and singlefill/planarization process where the aluminum metallization layersimultaneously fills the trench and a via below the trench, and whereinthe method includes planarizing the aluminum metallization layer.

R1. A method of fabricating a photonic structure comprising: forming astack of hardmask material over a layer of waveguiding material;depositing a stack of organic lithography material over the stack ofhardmask materials; and patterning the stack of organic lithographymaterial, wherein the patterning includes stopping at the stack ofhardmask material. R2. The method of R1, wherein the stack of hardmaskmaterial includes silicon dioxide. R3. The method of R1, wherein themethod includes patterning photonic features (in the layer ofwaveguiding material using the stack of organic lithography material.R4. The method of R1, wherein the patterning includes using reactive ionetching and wherein the method includes cleaning residue formed by thereactive ion etching. R5. The method of R1, wherein the patterningincludes using reactive ion etching, wherein the method includescleaning residue formed by the reactive ion etching, wherein the methodincludes patterning photonic features in the layer of waveguidingmaterial using the stack of organic lithography material, and whereinthe cleaning is performed subsequent to the patterning.

S1. A method of fabricating a photonic structure comprising: patterninga first set of photonic features in a first photonic layer, the firstphotonic layer formed of a first waveguiding material; and forming adielectric layer about the first set of photonic features, whereindielectric material of the dielectric layer includes a plasma-enhancedoxide. S2. The method of S1, wherein the forming includes using plasmaenhanced chemical vapor deposition (PECVD), and wherein the methodincludes forming a second dielectric layer above the dielectric layer toprovide corrected dielectric separation distance to one or moreadditional waveguiding layer. S3. The method of S1, wherein the formingincludes using plasma enhanced chemical vapor deposition (PECVD). S4.The method of S1, wherein the forming includes forming plasma-enhancedoxide material over the first photonic layer so that the plasma-enhancedoxide material preferentially deposits on horizontal surfaces withsuppressed deposition rates on vertical surface proximate feature edges,resulting in an overall non-conformal film topography. S5. The method ofS1, wherein the forming includes applying process conditions fordeposition of non-conformal oxide material deposition in a manner toprovide void-minimized filling of minimum feature size gaps. S6. Themethod of S1, wherein the method includes planarizing the dielectriclayer to provide processing planarity for further layers. S7. The methodof S1, wherein the method includes forming a second dielectric layerabove the dielectric layer to provide corrected dielectric separationdistance to one or more additional waveguiding layer.

T1. A method of fabricating a photonic structure comprising: forming aplurality of photonic layers; wherein the plurality of photonic layersincludes a first photonic layer and a second photonic layer; andpatterning the first photonic layer and the second photonic layer sothat each of the first photonic layer and the second photonic layerdefines one or more set of photonic features. T2. The method of T1,wherein the first photonic layer and the second photonic layer areformed of different waveguiding materials. T3. The method of T2, whereineach of the first photonic layer and the second photonic layer is formedof a waveguiding material selected from the group consisting ofcrystalline silicon, poly-crystalline silicon, amorphous silicon,silicon nitride, and silicon oxynitride. T4. The method of claim T1,wherein each of the first photonic layer and the second photonic layeris formed of a waveguiding material selected from the group consistingof crystalline silicon, poly-crystalline silicon, amorphous silicon,silicon nitride, and silicon oxynitride. T5. The method of claim T1,wherein the first photonic layer and the second photonic layer areformed of different waveguiding material and are formed at differentelevations. T6. The method of claim T1, wherein the first photonic layerand the second photonic layer are formed of different waveguidingmaterial and wherein the first photonic layer and the second photoniclayer are at a common elevation. T7. The method of claim T1, wherein abottom elevation of the first photonic layer and a bottom elevation ofthe second photonic layer are formed at a common elevation. T8. Themethod of claim T1, wherein the first photonic layer is at an elevationbelow the second photonic layer. T9. The method of claim T1, wherein theplurality of photonic layers includes the first photonic layer, thesecond photonic layer, a third photonic layer and a fourth photoniclayer. T10. The method of claim T1, wherein the plurality of photoniclayers includes the first photonic layer, the second photonic layer, athird photonic layer and fourth photonic layers, and wherein each of thefirst photonic layer, the second photonic layer, the third photoniclayer and the fourth photonic layer is formed at a different elevation.

U1. A method of fabricating a photonic structure comprising: forming aphotonic layer; and patterning the photonic layer to define one or moreset of photonic features, wherein the method is characterized by one ormore of the following selected from the group consisting of: (a) themethod is performed so that first and second sets of photonic featuresof different minimum thicknesses are defined in the photonic layer and(b) the method is performed so that sets of photonic features ofdifferent geometries are defined by the photonic layer. U2. The methodof claim 44, wherein the photonic layer is formed of a waveguidingmaterial selected from the group consisting of, poly-crystallinesilicon, amorphous silicon, silicon nitride, and silicon oxynitride.

V1. A photonic structure comprising: a wiring level having a conductivematerial formation that defines a wiring assembly, wherein theconductive material formation is formed of a metallization material; anda waveguiding layer patterned to define photonic features; wherein thewaveguiding layer is formed at an elevation of the photonic structurethat is in common with or higher than an elevation of the wiring level.V2. The photonic structure of claim V1, wherein the conductive materialformation is formed of a metallization material that is adapted toreflect light at wavelengths within a communication band of wavelengthsof from about 1.3 μm to about 1.55 μm. V3. The photonic structure ofclaim V1, wherein the conductive material formation is formed of ametallization material that is adapted to reflect light at wavelengthswithin a band of wavelengths of from about 900 nm to about 1600 nm. V4.The photonic structure of claim V1, wherein the waveguiding layer isformed of silicon nitride. V5. The photonic structure of claim V1,wherein the waveguiding layer is formed of a material selected from thegroup consisting of amorphous silicon and polysilicon. V6. The photonicstructure of claim V1, wherein the waveguiding layer is formed ofsilicon nitride deposited using plasma enhanced chemical vapordeposition. V7. The photonic structure of claim V1, wherein thewaveguiding layer is formed at an elevation higher than an elevation ofthe wiring level. V8. The photonic structure of claim V1, wherein thewaveguiding layer is formed at an elevation higher than an elevation ofthe wiring level and includes a first patterned section patterned todefine one or more set of photonic features and a second section alignedto the conductive material formation. V9. The photonic structure ofclaim V1, wherein the waveguiding layer is formed at an elevation higherthan an elevation of the wiring level and includes a first patternedsection patterned to define one or more set of photonic features and asecond section aligned to the conductive material formation so that thesecond section functions as a protect layer for the conductive materialformation.

W1. A photonic structure comprising: a first photonic feature; a secondphotonic feature; a third photonic feature; wherein the first photonicfeature, the second photonic feature and the third photonic feature areat a common elevation; wherein one or more of the first second or thirdphotonic feature is formed of a material other than monocrystallinesilicon. W2. The photonic structure of claim W1, wherein each of thefirst photonic feature, second photonic feature and third photonicfeature is formed of a material selected from the group consisting ofmonocrystalline silicon, polycrystalline silicon, amorphous silicon,silicon nitride, and silicon oxynitride.

The terminology used herein is for the purpose of describing particularembodiments only and is not intended to be limiting. As used herein, thesingular forms “a,” “an,” and “the” are intended to include the pluralforms as well, unless the context clearly indicates otherwise. It willbe further understood that the terms “comprise” (and any form ofcomprise, such as “comprises” and “comprising”), “have” (and any form ofhave, such as “has” and “having”), “include” (and any form of include,such as “includes” and “including”), and “contain” (and any formcontain, such as “contains” and “containing”) are open-ended linkingverbs. As a result, a method or device that “comprises,” “has,”“includes,” or “contains” one or more steps or elements possesses thoseone or more steps or elements, but is not limited to possessing onlythose one or more steps or elements. Likewise, a step of a method or anelement of a device that “comprises,” “has,” “includes,” or “contains”one or more features possesses those one or more features, but is notlimited to possessing only those one or more features. Forms of the term“defined by” encompass relationships where an element is partiallydefined by and relationships where an element is entirely defined by.Numerical identifiers herein, e.g. “first” and “second” are arbitraryterms to designate different elements without designating an ordering ofelements. Furthermore, a system method or apparatus that is configuredin a certain way is configured in at least that way, but may also beconfigured in ways that are not listed. Furthermore, a system method orapparatus set forth as having a certain number of elements can bepracticed with less than or greater than the certain number of elements.

The corresponding structures, materials, acts, and equivalents of allmeans or step plus function elements in the claims below, if any, areintended to include any structure, material, or act for performing thefunction in combination with other claimed elements as specificallyclaimed. The description of the present invention has been presented forpurposes of illustration and description, but is not intended to beexhaustive or limited to the invention in the form disclosed. Manymodifications and variations will be apparent to those of ordinary skillin the art without departing from the scope and spirit of the invention.The embodiment was chosen and described in order to best explain theprinciples of one or more aspects of the invention and the practicalapplication, and to enable others of ordinary skill in the art tounderstand one or more aspects of the invention for various embodimentswith various modifications as are suited to the particular usecontemplated.

What is claimed is:
 1. A method of fabricating a photonic structurecomprising: depositing a layer formed of nitride waveguiding material;patterning the layer formed of nitride waveguiding material to definephotonic features, wherein the depositing includes using plasma-enhancedchemical vapor deposition; and wherein the patterning the layer formedof nitride waveguiding material to define photonic features includespatterning the layer formed of nitride waveguiding material to define awaveguide, the method further comprising depositing a non-conformalhigh-aspect-ratio gap-filling dielectric material over the waveguide,wherein the method includes planarizing a dielectric layer defined bythe dielectric material to reduce an elevation of the dielectric layerand to provide processing planarity for a second dielectric layer,wherein the method includes depositing the second dielectric layer onthe dielectric layer and planarizing the second dielectric layer toreduce an elevation of the second dielectric layer.
 2. The method ofclaim 1, wherein the method includes performing treatment of the layerformed of nitride waveguiding material for correction of one or more ofcontamination, inclusions, voids, or non-stoichiometries, wherein thetreatment is selected from the group consisting of thermal annealing andexposure to radiation.
 3. The method of claim 1, wherein the methodfurther includes planarizing and smoothing the layer formed of nitridewaveguiding material.
 4. The method of claim 1, wherein the methodincludes performing treatment of the layer formed of nitride waveguidingmaterial, wherein the treatment includes thermal annealing.
 5. Themethod of claim 1, wherein the method includes performing treatment ofthe layer formed of nitride waveguiding material, wherein the treatmentincludes exposure to radiation.
 6. The method of claim 1, wherein themethod further includes planarizing the layer formed of nitridewaveguiding material.
 7. The method of claim 1, further comprisingdepositing dielectric material over the waveguide.
 8. The method ofclaim 1, further comprising depositing gap-filling dielectric materialover the waveguide.
 9. The method of claim 1, wherein the patterning thelayer formed of nitride waveguiding material to define photonic featuresincludes patterning the layer formed of nitride waveguiding material todefine a waveguide.
 10. The method of claim 9, wherein the methodincludes performing treatment of the layer formed of nitride waveguidingmaterial for correction of one or more of contamination, inclusions,voids, or non-stoichiometries, wherein the treatment is selected fromthe group consisting of thermal annealing and exposure to radiation. 11.The method of claim 9, wherein the method further includes planarizingand smoothing the layer formed of nitride waveguiding material.
 12. Themethod of claim 1, wherein the method includes performing treatment ofthe layer formed of nitride waveguiding material for correction of oneor more of contamination, inclusions, voids, or non-stoichiometries,wherein the treatment is selected from the group consisting of thermalannealing and exposure to radiation, wherein the method further includesplanarizing and smoothing the layer formed of nitride waveguidingmaterial.
 13. The method of claim 1, wherein the method further includesplanarizing and smoothing the layer formed of nitride waveguidingmaterial, wherein the depositing a non-conformal high-aspect-ratiomaterial includes depositing dielectric material to encapsulate thewaveguide, wherein the depositing a non-conformal high-aspect-ratiomaterial is performed so that the dielectric material preferentiallydeposits on horizontal surfaces of the waveguide with suppresseddeposition rates on vertical surfaces of the waveguide proximate featureedges, resulting in an overall non-conformal film topography, whereinthe planarizing the dielectric layer and the planarizing the seconddielectric layer are performed to provide corrected dielectricseparation distance to an additional waveguiding layer.
 14. The methodof claim 1, wherein the method includes performing treatment of thelayer formed of nitride waveguiding material for correction of one ormore of contamination, inclusions, voids, or non-stoichiometries,wherein the treatment is selected from the group consisting of thermalannealing and exposure to radiation, wherein the method further includesplanarizing and smoothing the layer formed of nitride waveguidingmaterial, wherein the depositing a non-conformal high-aspect-ratiomaterial includes depositing dielectric material to encapsulate thewaveguide, wherein the waveguide has vertical surfaces, wherein thedepositing a non-conformal high-aspect-ratio material is performed sothat the dielectric material preferentially deposits on horizontalsurfaces of the waveguide with suppressed deposition rates on verticalsurfaces of the waveguide proximate feature edges, resulting in anoverall non-conformal film topography, wherein the planarizing thedielectric layer and the planarizing the second dielectric layer areperformed to provide corrected dielectric separation distance to anadditional waveguiding layer that is deposited on the second dielectriclayer.
 15. The method of claim 1, wherein the method includes performingtreatment of the layer formed of nitride waveguiding material forcorrection of one or more of contamination, inclusions, voids, ornon-stoichiometries, wherein the treatment includes exposure toradiation, wherein the method further includes planarizing and smoothingthe layer formed of nitride waveguiding material using chemicalmechanical polishing, wherein the depositing a non-conformalhigh-aspect-ratio material includes depositing dielectric material toencapsulate the waveguide, wherein the waveguide has vertical surfaces,wherein the depositing a non-conformal high-aspect-ratio material isperformed so that the dielectric material preferentially deposits onhorizontal surfaces of the waveguide with suppressed deposition rates onvertical surfaces of the waveguide proximate feature edges, resulting inan overall non-conformal film topography, wherein the planarizing thedielectric layer defined by the dielectric material includes usingchemical mechanical polishing, wherein the planarizing the seconddielectric layer includes using chemical mechanical polishing, whereinthe planarizing the dielectric layer and the planarizing the seconddielectric layer are performed to provide corrected dielectricseparation distance to an additional waveguiding layer wherein themethod includes subjecting the layer formed of nitride waveguidingmaterial to line edge roughness mitigating treatment, the line edgeroughness mitigating treatment including oxidation treatment, wherein asa result of the oxidation treatment outermost portions of the nitridewaveguiding material are converted to oxide, and wherein the methodincludes removing the converted to oxide portions using an aqueoushydrofluoric acid solution.
 16. The method of claim 1, wherein thepatterning the layer formed of nitride waveguiding material to definephotonic features includes patterning the layer formed of nitridewaveguiding material to define a waveguide, wherein the method includesperforming treatment of the layer formed of nitride waveguiding materialfor correction of one or more of contamination, inclusions, voids, ornon-stoichiometries, wherein the treatment includes exposure toradiation, wherein the method further includes planarizing and smoothingthe layer formed of nitride waveguiding material using chemicalmechanical polishing, wherein the depositing a non-conformalhigh-aspect-ratio material includes depositing dielectric material toencapsulate the waveguide, wherein the waveguide is a rectangulargeometry waveguide, wherein the depositing a non-conformalhigh-aspect-ratio material is performed so that the dielectric materialpreferentially deposits on horizontal surfaces of the waveguide withsuppressed deposition rates on vertical surface proximate feature edges,resulting in an overall non-conformal film topography, wherein theplanarizing the dielectric layer defined by the dielectric materialincludes using chemical mechanical polishing, wherein the planarizingthe second dielectric layer includes using chemical mechanicalpolishing, wherein the planarizing the dielectric layer and theplanarizing the second dielectric layer are performed to providecorrected dielectric separation distance to an additional waveguidinglayer that is encapsulated by dielectric material and is of a differentmaterial than the waveguide, wherein the method includes subjecting thelayer formed of nitride waveguiding material to line edge roughnessmitigating treatment, the line edge roughness mitigating treatmentincluding oxidation treatment, wherein as a result of the oxidationtreatment outermost portions of the nitride waveguiding material areconverted to oxide, and wherein the method includes removing theconverted to oxide portions using an aqueous hydrofluoric acid solution.17. A method of fabricating a photonic structure comprising: patterninga first set of photonic features in a first photonic layer, the firstphotonic layer formed of a first waveguiding material; forming adielectric layer about the first set of photonic features, whereindielectric material of the dielectric layer includes a plasma-enhancedoxide; and wherein the forming includes forming plasma-enhanced oxidematerial over the first photonic layer so that the plasma-enhanced oxidematerial preferentially deposits on horizontal surfaces with suppresseddeposition rates on vertical surface proximate feature edges, resultingin an overall non-conformal film topography, wherein the formingincludes planarizing the dielectric layer to reduce an elevation of thedielectric layer and to provide processing planarity for a seconddielectric layer, wherein the method includes depositing the seconddielectric layer on the dielectric layer and planarizing the seconddielectric layer to reduce an elevation of the second dielectric layer.18. The method of claim 17, wherein the forming includes using plasmaenhanced chemical vapor deposition (PECVD), and wherein the methodincludes forming a second dielectric layer above the dielectric layer toprovide corrected dielectric separation distance to one or moreadditional waveguiding layer.
 19. The method of claim 17, wherein theforming includes using plasma enhanced chemical vapor deposition(PECVD), and wherein the first waveguiding material issingle-crystalline silicon.
 20. The method of claim 17, wherein theforming includes applying process conditions for deposition ofnon-conformal oxide material deposition in a manner to providevoid-minimized filling of minimum feature size gaps.
 21. The method ofclaim 17, wherein the method includes planarizing the dielectric layerto provide processing planarity for further layers.
 22. The method ofclaim 17, wherein the method includes forming a second dielectric layerabove the dielectric layer to provide corrected dielectric separationdistance to one or more additional waveguiding layer.
 23. The method ofclaim 17, wherein the patterning a first set of photonic features in afirst photonic layer includes patterning a waveguide in the firstphotonic layer, and wherein the forming a dielectric layer about thefirst set of photonic features includes forming a dielectric layer aboutthe waveguide.
 24. The method of claim 23, wherein the forming includesapplying process conditions for deposition of non-conformal oxidematerial deposition in a manner to provide void-minimized filling ofminimum feature size gaps.
 25. The method of claim 23, wherein themethod includes planarizing the dielectric layer to provide processingplanarity for further layers.
 26. The method of claim 23, wherein themethod includes forming a second dielectric layer above the dielectriclayer to provide corrected dielectric separation distance to one or moreadditional waveguiding layer.
 27. The method of claim 23, wherein theforming includes using plasma enhanced chemical vapor deposition(PECVD), and wherein the method includes forming a second dielectriclayer above the dielectric layer to provide corrected dielectricseparation distance to one or more additional waveguiding layer.
 28. Themethod of claim 23, wherein the forming includes using plasma enhancedchemical vapor deposition (PECVD), and wherein the patterning a firstset of photonic features in a first photonic layer includes patterning awaveguide in a single-crystalline layer of silicon on insulator wafer.29. The method of claim 17, wherein the patterning a first set ofphotonic features in a first photonic layer includes patterning awaveguide in the first photonic layer, and wherein the forming adielectric layer about the first set of photonic features includesforming a dielectric layer about the waveguide, wherein the formingincludes using plasma enhanced chemical vapor deposition (PECVD), andwherein the method includes forming a second dielectric layer above thedielectric layer to provide corrected dielectric separation distance toan additional waveguiding layer, wherein the forming includes applyingprocess conditions for deposition of non-conformal oxide material in amanner to provide filling of feature size gaps, wherein the methodincludes planarizing the second dielectric layer using chemicalmechanical polishing to provide processing planarity for the additionalwaveguiding layer and depositing the additional waveguiding layer, andwherein the method includes performing treatment of waveguiding materialof the additional waveguiding layer for correction of one or more ofcontamination, inclusions, voids, or non-stoichiometries, wherein thetreatment includes exposure to radiation.
 30. The method of claim 17,wherein the planarizing the dielectric layer and the planarizing thesecond dielectric layer are performed to provide corrected dielectricseparation distance to an additional waveguiding layer.
 31. The methodof claim 17, wherein the planarizing the dielectric layer includes usingchemical mechanical polishing, wherein the planarizing the seconddielectric layer includes using chemical mechanical polishing, whereinthe planarizing the dielectric layer and the planarizing the seconddielectric layer are performed to provide corrected dielectricseparation distance to an additional waveguiding layer deposited on thesecond dielectric layer.
 32. A method of fabricating a photonicstructure comprising: depositing a layer formed of nitride waveguidingmaterial; patterning the layer formed of nitride waveguiding material todefine photonic features, wherein the depositing includes usingplasma-enhanced chemical vapor deposition; and wherein the methodfurther includes planarizing and smoothing the layer formed of nitridewaveguiding material, wherein the method includes forming a dielectriclayer about the photonic features to encapsulate the photonic features,wherein the forming includes planarizing the dielectric layer to reducean elevation of the dielectric layer and to provide processing planarityfor a second dielectric layer, wherein the method includes depositingthe second dielectric layer on the dielectric layer and planarizing thesecond dielectric layer to reduce an elevation of the second dielectriclayer, wherein the planarizing the dielectric layer and the planarizingthe second dielectric layer are performed to provide correcteddielectric separation distance to an additional waveguiding layerdeposited on the second dielectric layer.
 33. The method of claim 32,wherein the planarizing the layer formed of nitride waveguiding materialincludes using chemical mechanical polishing.
 34. The method of claim32, wherein the method includes performing treatment of the layer formedof nitride waveguiding material for correction of one or more ofcontamination, inclusions, voids, or non-stoichiometries, wherein thetreatment is selected from the group consisting of thermal annealing andexposure to radiation.
 35. The method of claim 32, wherein the methodincludes performing treatment of the layer formed of nitride waveguidingmaterial for correction of non-stoichiometries.
 36. The method of claim32, wherein the method includes performing treatment of the layer formedof nitride waveguiding material, wherein the treatment includes thermalannealing.
 37. The method of claim 32, wherein the method includesperforming treatment of the layer formed of nitride waveguidingmaterial, wherein the treatment includes exposure to radiation.
 38. Themethod of claim 32, wherein the forming includes depositing a dielectriclayer depositing gap-filling dielectric material over the photonicfeatures.
 39. The method of claim 32, wherein the patterning the layerformed of nitride waveguiding material to define photonic featuresincludes patterning the layer formed of nitride waveguiding material todefine a waveguide.
 40. A method of fabricating a photonic structurecomprising: patterning a first set of photonic features in a firstphotonic layer, the first photonic layer formed of first waveguidingmaterial; forming a dielectric layer about the first set of photonicfeatures, wherein dielectric material of the dielectric layer includes aplasma-enhanced oxide; and wherein the method includes planarizing thedielectric layer to provide processing planarity for further layers,wherein the method further includes planarizing and smoothing the layerformed of first waveguiding material, wherein the first waveguidingmaterial is single crystalline silicon, wherein the planarizing thelayer formed of first waveguiding material includes using chemicalmechanical polishing, and wherein the planarizing the dielectric layerincludes using chemical mechanical polishing.
 41. The method of claim40, wherein the forming includes forming plasma-enhanced oxide materialover the first photonic layer so that the plasma-enhanced oxide materialpreferentially deposits on horizontal surfaces with suppresseddeposition rates on vertical surface proximate feature edges, resultingin an overall non-conformal film topography.
 42. The method of claim 40,wherein the planarizing the dielectric layer includes using chemicalmechanical polishing.
 43. The method of claim 40, wherein the formingincludes using plasma enhanced chemical vapor deposition (PECVD), andwherein the method includes forming a second dielectric layer above thedielectric layer to provide corrected dielectric separation distance toone or more additional waveguiding layer.
 44. The method of claim 40,wherein the forming includes using plasma enhanced chemical vapordeposition (PECVD), and wherein the method includes depositing a seconddielectric layer on the dielectric layer to provide corrected dielectricseparation distance to one or more additional waveguiding layer.
 45. Themethod of claim 40, wherein the forming includes using plasma enhancedchemical vapor deposition (PECVD).
 46. The method of claim 40, whereinthe forming includes applying process conditions for deposition ofnon-conformal oxide material deposition in a manner to providevoid-minimized filling of minimum feature size gaps.
 47. The method ofclaim 40, wherein the method includes planarizing the dielectric layerto provide processing planarity for further layers.
 48. The method ofclaim 40, wherein the method includes forming a second dielectric layerabove the dielectric layer to provide corrected dielectric separationdistance to one or more additional waveguiding layer.
 49. The method ofclaim 40, wherein the method includes depositing a second dielectriclayer on the dielectric layer to provide corrected dielectric separationdistance to one or more additional waveguiding layer.
 50. A method offabricating a photonic structure comprising: patterning a first set ofphotonic features in a first photonic layer, the first photonic layerformed of a first waveguiding material; forming a dielectric layer aboutthe first set of photonic features, wherein dielectric material of thedielectric layer includes a plasma-enhanced oxide; and wherein theforming includes forming plasma-enhanced oxide material over the firstphotonic layer so that the plasma-enhanced oxide material preferentiallydeposits on horizontal surfaces with suppressed deposition rates onright angle extending surfaces proximate feature edges, resulting in anoverall non-conformal film topography, the right angle extendingsurfaces extending at right angles with respect to the horizontalextending surface, wherein the forming includes initially depositing thedielectric layer so that a bottom elevation of the dielectric layer isat a higher elevation of than a top elevation of the first photonicslayer and planarizing the dielectric layer to reduce an elevation of thedielectric layer and provide processing planarity for a seconddielectric layer, wherein the method includes depositing the seconddielectric layer on the dielectric layer and planarizing the seconddielectric layer to reduce an elevation of the second dielectric layer,wherein the planarizing the dielectric layer and the planarizing thesecond dielectric layer are performed to provide corrected dielectricseparation distance to an additional waveguiding layer.
 51. The methodof claim 50, wherein the additional waveguiding layer is of a secondwaveguiding material different than the first waveguiding material, andwherein the additional waveguiding layer is deposited on the seconddielectric layer, wherein the first waveguiding material ismonocrystalline silicon and the second waveguiding material is siliconnitride.
 52. The method of claim 50, wherein the patterning a first setof photonic features in a first photonic layer includes patterning awaveguide in the first photonic layer, the first photonic layer being amonocrystalline silicon layer of a silicon on insulator wafer, whereinthe additional waveguiding layer is of a second waveguiding materialdifferent than the first waveguiding material, and wherein theadditional waveguiding layer is deposited on the second dielectriclayer, wherein the first waveguiding material is monocrystalline siliconand the second waveguiding material is silicon nitride.
 53. A method offabricating a photonic structure comprising: patterning a first set ofphotonic features in a first photonic layer, the first photonic layerformed of a first waveguiding material; forming a dielectric layer aboutthe first set of photonic features, wherein dielectric material of thedielectric layer includes a plasma-enhanced oxide; and wherein theforming includes initially depositing the dielectric layer so that abottom elevation of the dielectric layer is at a higher elevation ofthan a top elevation of the first photonics layer and planarizing thedielectric layer to reduce an elevation of the dielectric layer andprovide processing planarity for a second dielectric layer, wherein themethod includes depositing the second dielectric layer on the dielectriclayer and planarizing the second dielectric layer to reduce an elevationof the second dielectric layer, wherein the planarizing the dielectriclayer and the planarizing the second dielectric layer are performed toprovide corrected dielectric separation distance to an additionalwaveguiding layer, wherein the patterning a first set of photonicfeatures in a first photonic layer includes patterning a waveguide inthe first photonic layer, the first photonic layer being amonocrystalline silicon layer of a silicon on insulator wafer, whereinthe additional waveguiding layer is of a second waveguiding materialdifferent than the first waveguiding material, and wherein theadditional waveguiding layer is deposited on the second dielectriclayer, wherein the first waveguiding material is monocrystalline siliconand the second waveguiding material is silicon nitride.
 54. A method offabricating a photonic structure comprising: patterning a first set ofphotonic features in a first photonic layer, the first photonic layerformed of a first waveguiding material; forming a dielectric layer aboutthe first set of photonic features, wherein dielectric material of thedielectric layer includes a plasma-enhanced oxide; and wherein theforming includes initially depositing the dielectric layer so that abottom elevation of the dielectric layer is at a higher elevation ofthan a top elevation of the first photonics layer and planarizing thedielectric layer to reduce an elevation of the dielectric layer andprovide processing planarity for a second dielectric layer, wherein themethod includes depositing the second dielectric layer on the dielectriclayer and planarizing the second dielectric layer to reduce an elevationof the second dielectric layer, wherein the planarizing the dielectriclayer and the planarizing the second dielectric layer are performed toprovide corrected dielectric separation distance to an additionalwaveguiding layer, wherein the patterning a first set of photonicfeatures in a first photonic layer includes patterning a waveguide inthe first photonic layer to include a horizontal surface and a rightangle extending surface extending at a right angle with respect to thehorizontal surface, the first photonic layer being a monocrystallinesilicon layer of a silicon on insulator wafer, wherein the additionalwaveguiding layer is of a second waveguiding material different than thefirst waveguiding material, and wherein the additional waveguiding layeris deposited on the second dielectric layer, wherein the firstwaveguiding material is monocrystalline silicon and the secondwaveguiding material is silicon nitride.
 55. A method of fabricating aphotonic structure comprising: patterning a first set of photonicfeatures in a first photonic layer, the first photonic layer formed of afirst waveguiding material; forming a dielectric layer about the firstset of photonic features, wherein dielectric material of the dielectriclayer includes a plasma-enhanced oxide; and wherein the forming includesinitially depositing the dielectric layer so that a bottom elevation ofthe dielectric layer is at a higher elevation of than a top elevation ofthe first photonics layer and planarizing the dielectric layer to reducean elevation of the dielectric layer and provide processing planarityfor a second dielectric layer, wherein the method includes depositingthe second dielectric layer on the dielectric layer and planarizing thesecond dielectric layer to reduce an elevation of the second dielectriclayer, wherein the planarizing the dielectric layer and the planarizingthe second dielectric layer are performed to provide optical isolationbetween the first photonic layer and the additional waveguiding layer,wherein the patterning a first set of photonic features in a firstphotonic layer includes patterning a waveguide in the first photoniclayer to include a horizontal surface and a right angle extendingsurface extending at a right angle with respect to the horizontalsurface, the first photonic layer being a monocrystalline silicon layerof a silicon on insulator wafer, wherein the additional waveguidinglayer is of a second waveguiding material different than the firstwaveguiding material, and wherein the additional waveguiding layer isdeposited on the second dielectric layer, wherein the first waveguidingmaterial is monocrystalline silicon and the second waveguiding materialis silicon nitride.
 56. A method of fabricating a photonic structurecomprising: patterning a first set of photonic features in a firstphotonic layer, the first photonic layer formed of a first waveguidingmaterial; forming a dielectric layer about the first set of photonicfeatures, wherein dielectric material of the dielectric layer includes aplasma-enhanced oxide; and wherein the forming includes formingplasma-enhanced oxide material over the first photonic layer so that theplasma-enhanced oxide material preferentially deposits on horizontalsurfaces with suppressed deposition rates on vertical surface proximatefeature edges, resulting in an overall non-conformal film topography,wherein the patterning a first set of photonic features in a firstphotonic layer includes patterning a waveguide in the first photoniclayer, and wherein the forming a dielectric layer about the first set ofphotonic features includes forming a dielectric layer about thewaveguide, wherein the forming includes using plasma enhanced chemicalvapor deposition (PECVD), and wherein the method includes forming asecond dielectric layer above the dielectric layer to provide correcteddielectric separation distance to one or more additional waveguidinglayer, wherein the forming includes applying process conditions fordeposition of non-conformal oxide material in a manner to providefilling of feature size gaps, wherein the method includes planarizingthe dielectric layer using chemical mechanical polishing to provideprocessing planarity for further layers, and wherein the method includesperforming treatment of nitride waveguiding material of the one or moreadditional waveguiding layer for correction of one or more ofcontamination, inclusions, voids, or non-stoichiometries, wherein thetreatment includes exposure to radiation.